Serveur d'exploration sur le LRGP - Analysis (Allemagne)

Index « Auteurs » - entrée « Christoph Suehnel »
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Christoph Schmidt < Christoph Suehnel < Christophe A. Serra  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 1.
Ident.Authors (with country if any)Title
000172 (1990) Christoph Suehnel [Allemagne]ASIC design: progress in the GDR

List of associated KwdEn.i

Nombre de
documents
Descripteur
1Absolute placement
1Artificial intelligence
1Asic
1Asic design
1Asics
1Block placement
1Cell catalogue
1Cell system
1Chip size
1Circuit description
1Clock frequency
1Clock path
1Clock rate
1Clock signal
1Clock signals
1Cmos
1Cmos technologies
1Cmos technology
1Complex macros
1Conference series
1Configurable input logic
1Control signals
1Data line
1Data output
1Description language
1Design data
1Design process
1Design steps
1Design support
1Design system
1Dialogue support
1Digital sound broadcasting
1Dynamic behaviour
1Edge description
1Error correction
1Event principle
1Final edge description
1Function blocks
1Functional test
1Gate array
1Gate array system
1Gate arrays
1General description
1Hardware macros
1Hexadecimal code
1High phase
1Hungarian custom circuits conf
1Input capacitance
1Input information
1Input pattern
1Interface
1Interface stages
1Interface units
1Kosim simulator
1Layout
1Logical description
1Lssd
1Lssd method
1Lssd test
1Macro
1Main features
1Master chip
1Maximum clock rate
1Maximum output load
1Metal layer
1Mode control signal
1Module
1Network description
1Output signal
1Output stages
1Output units
1Power supply
1Propagation delay times
1Regular structures
1Scale factor
1Shift mode
1Shift slave
1Simulation
1Simulation pattern
1Simulation results
1Simulator
1Simulator works
1Small number
1Software
1Software macros
1Sound broadcasting
1Sound signal
1Special features
1Standard cells
1Structural test
1Symbolic layout
1System archimedes
1System clock
1Technological layout
1Test pattern
1Test patterns
1Transfer gate
1Transistor
1Transmission gates
1Useful signal

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