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Serveur d'exploration sur l'Indium - Analysis (Russie)

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Electrothermal instability < Elemental semiconductors < Ellipsometry  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 14.
Ident.Authors (with country if any)Title
000534 (2003-07-11) Doping of Magic Nanoclusters in the Submonolayer In/Si(100) System
000A82 (2000-05-08) Structure and optical properties of Si/InAs/Si layers grown by molecular beam epitaxy on Si substrate
000C28 (1999-11-15) Analysis of surface structures through determination of their composition using STM: Si(100)4×3-In and Si(111)4×1-In reconstructions
000C89 (1999-06) Diffusion properties of plastically deformed silicon crystals
000D00 (1999-05) Adsorption of atomic hydrogen on the Si(001) 4×3-In surface studied by coaxial impact collision ion scattering spectroscopy and scanning tunneling microscopy
000D04 (1999-04) Strain-induced photoreflectance spectra in the vicinity of the E0 transition in GaAs/Si and InP/Si heterostructures
000D06 (1999-04) Oscillations in the induced photopleochroism of In(Au)/Si thin-film structures
000D20 (1999-03) Dopant impurity diffusion from polymer diffusants and its applications in semiconductor device technology. A review
000E71 (1998-05-15) Structural model for the Si(100)4×3-In surface phase
000E88 (1998-04) Electric and photoelectric properties of n-GaxIn1-xN/p-Si anisotypic heterojunctions
000E94 (1998-03) Photosensitivity of porous silicon-layered III-VI semiconductors heterostructures
000F99 (1997-09-15) STM tip-induced diffusion of In atoms on the Si(111)×-In surface
001015 (1997-07-15) Structural model for the Si(111)-4×1-In reconstruction
001019 (1997-07) Polarization photosensitivity of silicon solar cells with an antireflection coating consisting of a mixture of indium and tin oxides

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