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Serveur d'exploration sur l'Indium - Analysis (Russie)

Index « Auteurs » - entrée « R. M. Imamov »
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R. M. Gadzhieva < R. M. Imamov < R. M. Imanov  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
000021 (2013) Metamorphic InAlAs/InGaAs/InAlAs/GaAs HEMT heterostructures containing strained superlattices and inverse steps in the metamorphic buffer
000446 (2004) Structural diagnostics of 'quantum' layers by X-ray diffraction and standing waves
000655 (2003) InAs quantum dots in multilayer GaAs-based heterostructures
000878 (2001-09) Structure of the Interfaces of the InxGa1 - xAs Quantum Well from X-ray Diffraction Data
000A55 (2000-07-20) Structural Characteristics of Multicomponent GaAs-InxGa1 - xAs System from Double-Crystal X-ray Diffractometry Data
000A77 (2000-06) Low-Temperature Photoluminescence and X-ray Diffractometry Study of InxGa1 - xAs Quantum Wells
001421 (1994-08) Study of an InGaAs/GaAs(100) heterostructure by high-resolution x-ray diffractometry
001664 (1992) Investigation of the structure of real indium antimonide surfaces by the asymptotic Bragg diffraction method

List of associated KwdEn.i

Nombre de
documents		Descripteur
6Experimental study
6Gallium arsenides
6XRD
4Heterostructures
4III-V semiconductors
4Indium arsenides
4Molecular beam epitaxy
3Indium compounds
2Binary compounds
2Interface structure
2Quantum dots
2Semiconductor quantum wells
1Aluminium
1Arsenic compounds
1Binary alloys
1Bragg diffraction
1Crystal defect
1Crystal face
1Crystal structure
1Crystalline structure
1Defect structure
1Dislocation
1Electron microscopy
1Excitons
1Formation mechanism
1Gallium compounds
1Ge-Si alloys
1Hall effect
1Hall mobility
1High electron mobility transistor
1High-resolution methods
1III-V compound
1Indium Antimonides
1Inorganic compound
1Interfacial layer
1Lattice parameters
1Multilayers
1Nanostructured materials
1Ordering
1Oxide layer
1Photoluminescence
1Quantum well
1Quantum wells
1Reflectivity
1Semiconductor alloys
1Silicon
1Standing waves
1Strained superlattice
1Surface defect
1Surface structure
1Ternary compounds
1Theoretical model
1Thin films
1Transmission electron microscopy
1Wetting
1X ray diffraction

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