| Ident. | Authors (with country if any) | Title |
|---|
| 000269 |
| Characterization of InP porous layer by high-resolution X-ray diffraction |
| 000408 |
| Determining Parameters of a Multilayer Heterostructure by Joint Analysis of the X-ray Rocking Curves Measured for Various Crystallographic Planes |
| 000878 |
| Structure of the Interfaces of the InxGa1 - xAs Quantum Well from X-ray Diffraction Data |
| 000A55 |
| Structural Characteristics of Multicomponent GaAs-InxGa1 - xAs System from Double-Crystal X-ray Diffractometry Data |
| 000A77 |
| Low-Temperature Photoluminescence and X-ray Diffractometry Study of InxGa1 - xAs Quantum Wells |
| 001421 |
| Study of an InGaAs/GaAs(100) heterostructure by high-resolution x-ray diffractometry |
| 001664 |
| Investigation of the structure of real indium antimonide surfaces by the asymptotic Bragg diffraction method |
