Auteurs
Analysis
France
Racine
Analysis
France
Repository
Accueil
Racine
Racine

Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « M. Erman »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
M. Eremets < M. Erman < M. Esteban  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 17.
Ident.Authors (with country if any)Title
002649 (1993) InP digital optical swithc: key element for guided-wave photonic switching
002843 (1992) Monolithic integration of GaInAsP/InP carrier depletion directional couplers and GaInAs p-i-n detectors on semi-insulating InP
002852 (1992) Low driving voltage or current digital optical switch on InP for multiwavelength system applications
002873 (1992) InP/GaInAsP guided-wave phase modulators based on carrier-induced effects : theory and experiment
002933 (1992) Accurate determination of waveguide-fed p-i-n photodiode absorption
002958 (1991) Wafer and epilayer improvement for integrated optics devices on InP: the ESPRIT project 2518
002995 (1991) Optical circuits and integrated detectors
002A31 (1991) First digital optical switch based on InP/GaInAsP double heterostructure waveguides
002B07 (1990) Spatially-resolved photoluminescence study of InP : Fe substrates from different suppliers
002B43 (1990) Integration of detectors with GaInAsP/InP carrier depletion optical switches
002B86 (1990) Chemical and structural analysis by ellipsometry and x-ray reflectometry of thin sulfide layers grown on InP
002C75 (1989) Extremely low loss InP/GalnAsP RIB waveguides
002C84 (1989) Characterization of Fe-doped semi-insulating InP by low temperature and room temperature spatially resolved photoluminescence
002E84 (1987) Spatially resolved ellipsometry for semiconductor process control: applicatin to GaInAs MIS structures
002F63 (1986) Réalisations de jonctions Y et de branchements X : réalisation et test de lames semi-réfléchissantes. Modélisation et comparaison des performances
002F89 (1986) Spectroscopic ellipsometry study of InP, GaInAs, and GaInAs/InP heterostructures
003023 (1986) Ga1-xInxAs-InP abrupt heterostructures grown by MOVPE AT ATMOSPHERIC PRESSURE

List of associated KwdEn.i

Nombre de
documents		Descripteur
14Indium Phosphides
6Experimental study
6Integrated optics
5Gallium Indium Arsenides Mixed
5Optical switch
5Optical waveguide
4Directional coupler
4Gallium Indium Arsenides phosphides Mixed
3Ellipsometry
3Photodetector
3Photoluminescence
3Semiconductor materials
3Thin film
3Waveguide junction
3Y shape
3p i n diode
2Crystal growth
2Dielectric function
2Digital switching
2Double heterojunction
2Electrical conductivity
2Heterojunction
2III-V compound
2Inorganic compound
2Manufacturing
2Optical coupler
2Performance characteristic
2Phase modulation
2Theoretical study
2Waveguide
1Abrupt junction
1Absorption
1Aluminium Gallium Arsenides Mixed
1Amorphization crystallization
1Characterization
1Chemical composition
1Chemical etching
1Chemical vapor deposition
1Circuit theory
1Computer simulation
1Crosstalk
1Current distribution
1Czochralski method
1Density of states
1Depletion
1Detector
1Digital switch
1Dislocation
1Dislocation density
1Doping
1Electrical characteristic
1Epitaxy
1Field effect transistor
1Frequency response
1Gallium Arsenides
1Gallium Indium Phosphides Arsenides Mixed
1Gallium Indium Phosphides Mixed
1Grazing incidence
1Hall mobility
1High resolution
1Impurity density
1Instrumentation
1Interface electron state
1Ion beam etching
1Layout
1Liquid encapsulation
1MIS structure
1Measurement
1Models
1Monolithic integrated circuit
1Optical characteristic
1Optical circuit
1Optical fiber
1Optical modulator
1Optical switching
1Organometallic compound
1P i n diode
1Passivation
1Performance
1Photodiode
1Plasma condensation
1Polarization mode
1Process control
1Propagation mode
1Push pull connection
1Radiation detector
1Reactive ion etching
1Reflectometry
1Refraction index
1Rib waveguide
1Semiconductor device
1Silicon Nitrides
1Single mode waveguide
1Substrate
1Sulfurization
1Surface treatment
1Switching conditions
1Technical report
1Temperature
1Thermal method

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i -k "M. Erman" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "M. Erman" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    M. Erman
}}
Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024