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Field-induced diffusion of gold and related phase transformations in the C60 and C70 fullerenes

Identifieur interne : 001560 ( France/Analysis ); précédent : 001559; suivant : 001561

Field-induced diffusion of gold and related phase transformations in the C60 and C70 fullerenes

Auteurs : RBID : Pascal:99-0282397

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English descriptors

Abstract

The intercalation of metal M (M=Au, Ag, In) from the electrode into the polycrystalline C60 and C70 thin films is studied by time-dependent and space-resolved conductivity measurements under controlled oxygen-free atmosphere at different temperatures and electric fields. The time resistivity behavior is interpreted on the basis of electric-field-induced diffusion of metal ions from the electrodes to the interstitials of the fullerene crystal lattice and local formation of MxC60 and MxC70 phases. A comparison between the resistivity behaviors of C60 and C70 thin films provides evidence that the process is sensitive to the electronic level structure of the fullerenes molecules.

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Pascal:99-0282397

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<term>Experimental study</term>
<term>Fullerene compounds</term>
<term>Fullerenes</term>
<term>Gold compounds</term>
<term>Indium compounds</term>
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<term>Silver compounds</term>
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<term>Temperature dependence</term>
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<term>Dépendance température</term>
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<term>Argent composé</term>
<term>Or composé</term>
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<div type="abstract" xml:lang="en">The intercalation of metal M (M=Au, Ag, In) from the electrode into the polycrystalline C
<sub>60</sub>
and C
<sub>70</sub>
thin films is studied by time-dependent and space-resolved conductivity measurements under controlled oxygen-free atmosphere at different temperatures and electric fields. The time resistivity behavior is interpreted on the basis of electric-field-induced diffusion of metal ions from the electrodes to the interstitials of the fullerene crystal lattice and local formation of M
<sub>x</sub>
C
<sub>60</sub>
and M
<sub>x</sub>
C
<sub>70</sub>
phases. A comparison between the resistivity behaviors of C
<sub>60</sub>
and C
<sub>70</sub>
thin films provides evidence that the process is sensitive to the electronic level structure of the fullerenes molecules.</div>
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<sub>60</sub>
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C
<sub>60</sub>
and M
<sub>x</sub>
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