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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Keywords » - entrée « Leakage current »
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Leak < Leakage current < Leakage currents  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 11.
Ident.Authors (with country if any)Title
000333 (2013) A reduced electron-extraction barrier at an interface between a polymer poly(3-hexylthiophene) layer and an indium tin oxide layer
000476 (2012) Low-Voltage High-Stability Indium-Zinc Oxide Thin-Film Transistor Gated by Anodized Neodymium-Doped Aluminum
000595 (2012) CuInSe2 nanocrystals/CdS quantum dots/ZnO nanowire arrays heterojunction for photovoltaic applications
000834 (2011) High-Performance Indium-Gallium-Zinc Oxide Thin-Film Transistors Based on Anodic Aluminum Oxide
000835 (2011) High-Performance Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors With HfOxNy/HfO2/HfOxNy Tristack Gate Dielectrics
001071 (2008) Pentacene thin-film transistors with sol-gel derived amorphous Ba0.6Sr0.4TiO3 gate dielectric
001179 (2008) Effects of indium ion implantation on the total dose hardness of fully depleted SOI NMOSFET
001257 (2007) Transparent thin-film transistors using ZnMgO as dielectrics and channel
001D73 (2002) Fabrication of high-brightness blue InGaN/GaN MQW LEDs
002715 (1995) High-barrier Pt/Al/n-InP diode
002773 (1994-01) Influences of δ -doping time and spacer thickness on the mobility and two-dimensional electron gas concentration in δ -doped GaAs/InGaAs/GaAs pseudomorphic heterostructures

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