Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Keywords » - entrée « Heterojunction bipolar transistors »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
Heterojunction < Heterojunction bipolar transistors < Heterojunction transistor  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 34.
[0-20] [0 - 20][0 - 34][20-33][20-40]
Ident.Authors (with country if any)Title
000213 (2013) InP/InGaAs/InP DHBT structures with high carbon-doped base grown by gas source molecular beam epitaxy
000326 (2013) An improved model for InP/InGaAs double heterojunction bipolar transistors
000368 (2012) The model parameter extraction and simulation for the effects of gamma irradiation on the DC characteristics of InGaP/GaAs single heterojunction bipolar transistors
000643 (2012) A Combined Model With Electrothermal Coupling and Electromagnetic Simulation for Microwave Multifinger InP-Based DHBTs
000809 (2011) Influence of a Barrier Layer on the Formation of AuBe Ohmic Contact With the p-GaAs Bases of Heterojunction Bipolar Transistors
000811 (2011) InP/InGaAs/InP DHBT structures with graded composition base grown by gas source molecular beam epitaxy
000863 (2011) Extrinsic Base Surface Passivation in Terahertz GaAsSb/InP DHBTs Using InGaAsP Ledge Structures
000C50 (2010) A Composite Transistor to Suppress Kink Phenomenon in HBTs for Broadband Design
001018 (2008) Surface-recombination-free InGaAs/InP HBTs and the base contact recombination
001027 (2008) Study on Applications of Terahertz technology
001210 (2008) Common-base multi-finger submicron InGaAs/InP double heterojunction bipolar transistor with fmax of 305 GHz
001388 (2007) Heavily carbon-doped p-type InGaAs grown by gas source molecular beam epitaxy for application to heterojunction bipolar transistors
001609 (2006) InGaP/GaAs heterojunction bipolar transistor grown by solid-source molecular beam epitaxy with a GaP decomposition source
001802 (2005) Improved analytical method for determination of small-signal equivalent-circuit model parameters for InP/InGaAs HBTs
001836 (2005) Direct extraction of InP HBT noise parameters based on noise-figure measurement system
001846 (2005) Comments on: Microwave noise modeling for InP-InGaAs HBTs. Authors' reply
001899 (2004-04) Reduction in Turn-on Voltage in GaInNAs and InGaAs-Based Double-Heterojunction Bipolar Transistors
001A39 (2004) Characteristics of an InP-InGaAs-InGaAsP HBT
001A52 (2003-12-29) Breakdown characteristics of InP/InGaAs composite-collector double heterojunction bipolar transistor
001A62 (2003-11) Investigation of InGaP/GaAs heterojunction bipolar transistor with doping graded base
001A71 (2003-09-29) Multiple negative differential resistance of InP/InGaAs superlattice-emitter resonant-tunneling bipolar transistor at room temperature

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/Chine/Analysis
HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/KwdEn.i -k "Heterojunction bipolar transistors" 
HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/KwdEn.i  \
                -Sk "Heterojunction bipolar transistors" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/Chine/Analysis/biblio.hfd 

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    Chine
   |étape=   Analysis
   |type=    indexItem
   |index=    KwdEn.i
   |clé=    Heterojunction bipolar transistors
}}

Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024