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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Keywords » - entrée « Electrical measurement »
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Electrical conductor < Electrical measurement < Electrical noise  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 10.
Ident.Authors (with country if any)Title
000039 (2014) Bias voltage dependence properties of Nb-doped indium tin oxide thin films by RF magnetron sputtering at room temperature
000100 (2013) Study of carrier mobility of N,N'-diphenyl-N,N' bis(1,1'-biphenyl)-4,4'-diamine (NPB) by transmission line model of impedance spectroscopy
000197 (2013) Inverted polymer solar cells integrated with small molecular electron collection layer
000770 (2011) Optical and electrical properties of zinc oxide/indium/zinc oxide multilayer structures
000930 (2011) Copper doped nickel oxide transparent p-type conductive thin films deposited by pulsed plasma deposition
000C84 (2009) The influence of alloy phases in the precursors on the selenization reaction mechanisms
000D56 (2009) Properties of indium tin oxide films deposited on unheated polymer substrates by ion beam assisted deposition
000D93 (2009) Novel in situ resistance measurement for the investigation of CIGS growth in a selenization process
001013 (2008) Synthesis of high quality p-type Zn3P2 nanowires and their application in MISFETs
001199 (2008) Dependence of electrical and optical properties on thickness of tungsten-doped indium oxide thin films

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