Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « Y. W. Zhao »
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Y. W. Zeng < Y. W. Zhao < Y. Wang  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 9.
Ident.Authors (with country if any)Title
001224 (2008) Annihilation of deep level defects in InP through high temperature annealing
001644 (2006) Electron irradiation-induced defects in InP pre-annealed at high temperature
001804 (2005) Hydrogen indium vacancy complex VInH4 in n-type InP studied by positron-lifetime
001A42 (2004) Annealing ambient controlled deep defect formation in InP
001C69 (2002-08-15) Deep levels in semi-insulating InP obtained by annealing under iron phosphide ambiance
001D45 (2002) Photoluminescence assessment of undoped semi-insulating InP wafers obtained by annealing in iron phosphide vapour
002134 (2000) Carrier mobility distribution in annealed undoped LEC InP material
002296 (1998-11-15) Positron-lifetime study of compensation defects in undoped semi-insulating InP
002326 (1998-04-27) Formation of PIn defect in annealed liquid-encapsulated Czochralski InP

List of associated KwdEn.i

Nombre de
documents
Descripteur
7Annealing
5Experimental study
5III-V semiconductors
4Defect formation
4Defect states
4Indium phosphides
4Semiconductor materials
3Binary compounds
3DLTS
3Deep energy levels
3Deep level
3Indium compounds
2Charge compensation
2Crystal growth from melts
2Defect absorption spectra
2Impurity absorption spectra
2Impurity states
2Indium phosphide
2Infrared spectra
2Iron
2Iron additions
2Positron annihilation
2Thermostimulated conduction
2Vacancies
1Annealing temperature
1Binary compound
1Carrier density
1Carrier mobility
1Complex defect
1Crystal defects
1Czochralski method
1Defect annihilation
1Defect characterization
1Defect density
1Defect detection
1Defect level
1Diffusion
1Donor center
1Doping
1Electrical conductivity
1Electrical properties
1Electron beam
1Electron irradiation
1Fourier transform spectra
1Hall conductivity
1Hall effect
1Heat treatments
1High temperature
1Illumination
1Impurity-defect interactions
1Impurity-vacancy interactions
1Inorganic compound
1Ionization potential
1Iron phosphides
1Irradiation defect
1Liquid encapsulation
1Phosphorus
1Photoinduction
1Photoluminescence
1Point defects
1Radiation effect
1Stoichiometry
1Temperature dependence
1Thermal annealing
1Transition metal
1Valence
1Wafers

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