Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « Y. Jin »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
Y. Jiang < Y. Jin < Y. K. Li  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
002381 (1998) Microcavity effect and InGaAs/InGaAsP MQW microdisk laser
002386 (1998) Linewidth in microdisk laser
002476 (1997) Two kinds of crystalline state of InSb epilayers on GaAs substrates by metalorganic chemical vapor deposition
002505 (1997) Isotropic growth islands of Ga0.16In0.84As0.80Sb0.20 epilayer grown by metalorganic chemical vapour deposition
002593 (1996) Scanning electron acoustic microscopy of semiconductor materials
002716 (1995) Growth of GaInAsSb alloys by metalorganic chemical vapor deposition
002719 (1995) GaInAsSb/GaSb infrared photodetectors prepared by MOCVD

List of associated KwdEn.i

Nombre de
documents
Descripteur
5Experimental study
4Quaternary compounds
4Semiconductor materials
3Epitaxial layers
3MOCVD
3Surfaces
2Acoustic microscopy
2Atmospheric pressure
2Binary compounds
2Crystal growth from vapors
2Gallium Arsenides
2Gallium arsenides
2Indium Phosphides
2Indium antimonides
2Multiple quantum well
2Semiconductor lasers
2Ternary compounds
2XRD
1Acoustic properties
1Antimony alloys
1Arsenic Antimonides
1Arsenic alloys
1Atomic force microscopy
1Bias voltage
1Binary alloys
1Binary compound
1Characterization
1Chemical vapor deposition
1Cross section
1Crystal nucleation
1Crystal perfection
1Crystalline state
1Dark current
1Detection
1Electrical characteristic
1Gallium Antimonides
1Gallium Antimonides arsenides
1Gallium Phosphides
1Gallium alloys
1Gallium antimonides
1Heteroepitaxy
1Heterojunction
1III-V compound
1Indium Antimonides
1Indium Antimonides arsenides
1Indium Arsenides
1Indium alloys
1Indium arsenides
1Infrared detector
1Interface properties
1Interfaces
1Island structure
1Kinetics
1Microelectronic fabrication
1Morphology
1Operating mode
1Optical characteristic
1Organometallic compound
1Photodetector
1Production process
1Quaternary alloys
1Quaternary compound
1Response latency
1SEM
1Spectral line width
1Spontaneous emission
1Subsurface layer
1Voltage current curve

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/Chine/Analysis
HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/Author.i -k "Y. Jin" 
HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/Author.i  \
                -Sk "Y. Jin" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/Chine/Analysis/biblio.hfd 

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    Chine
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    Y. Jin
}}

Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024