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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « X. Zhang »
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X. Z. Zhao < X. Zhang < X. Zhao  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 10.
Ident.Authors (with country if any)Title
001391 (2007) Growth and characterization of electro-deposited Cu2O and Cu thin films by amperometric I-T method on ITO/glass substrate
001784 (2005) Low threshold distribution feedback quantum cascade lasers at 7.6μm grown by gas source molecular beam epitaxy
001877 (2004-06-15) Identifying Au-based Te alloys for optical data storage
001B30 (2003) The effects of (NH4)2S passivation treatments on the dark current-voltage characteristics of InGaAsSb PIN detectors
002350 (1998) The study of single mode 650nm AlGaInP quantum well laser diodes for DVD
002376 (1998) Operating characteristics of InGaAsP/GaAs SCH SQW high power lasers by LPE
002398 (1998) High temperature operation of 650nm AlGaInP quantum well laser diodes grown by LP-MOCVD
002433 (1998) 808nm Al-free InGaAsP/GaAs SCH SQW lasers fabricated by LPE
002491 (1997) Study of Cr overlayer on InP(100) by synchrotron radiation photoemission
002716 (1995) Growth of GaInAsSb alloys by metalorganic chemical vapor deposition

List of associated KwdEn.i

Nombre de
documents		Descripteur
5Quaternary compounds
4Experimental study
4Indium Phosphides
4Quantum wells
4Semiconductor lasers
3Gallium arsenides
3Indium arsenides
2Aluminium Phosphides
2Binary compounds
2Crystal growth from vapors
2Epitaxy
2Gallium Arsenides
2Gallium Phosphides
2Gallium antimonides
2High power
2Indium antimonides
2Injection laser
2MOVPE method
2SCH lasers
2Thin films
2XRD
1Aluminium arsenides
1Antimony alloys
1Atmospheric pressure
1Atomic force microscopy
1Binary compound
1Chalcogenide glasses
1Characterization
1Chromium
1Codeposition
1Copper
1Copper oxides
1Coverage rate
1Crystal perfection
1Crystal structure
1Current density
1Cyclic voltammetry
1Dark current
1Doping
1Electric resistivity
1Electrodeposition
1Electronic structure
1Emission spectra
1Film growth
1GSMBE method
1Gold alloys
1Holography
1Indium alloys
1Indium phosphides
1Infrared detector
1Interface structure
1Lamellar structure
1Linear phase
1Liquid phase
1Low pressure
1MOCVD
1Molecular beam epitaxy
1Operating mode
1Optical storage
1Passivation
1Performance characteristic
1Performance evaluation
1Photodetector
1Photoelectron spectroscopy
1Quantum cascade laser
1Quaternary compound
1Recrystallization
1Scanning electron microscopy
1Semiconductor materials
1Semiconductor thin films
1Silicon additions
1Single mode laser
1Synchrotron radiation
1Tellurium alloys
1Thick films
1Transition elements
1Voltage current curve
1X-ray photoelectron spectra
1p i n photodiodes

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