Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « Wen-Chau Liu »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
Wen-Chang Jiang < Wen-Chau Liu < Wen-Chen Zheng  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 22.
[0-20] [0 - 20][0 - 22][20-21][20-40]
Ident.Authors (with country if any)Title
001911 (2004-03) Study of InGaP/InGaAs double delta-doped channel heterostructure field-effect transistors
001A39 (2004) Characteristics of an InP-InGaAs-InGaAsP HBT
001A63 (2003-11) Comparative hydrogen sensing performances of Pd- and Pt-InGaP metal-oxide-semiconductor Schottky diodes
001B18 (2003-01) Study on dc characteristics of an interesting InP/InGaAs tunneling-emitter bipolar transistor with double heterostructures
001C83 (2002-05) Study of InGaP/GaAs/InGaAs high-barrier gate and heterostructure-channel field-effect transistors
001E41 (2001-08-13) Improved n+-GaAs/p+-In0.49Ga0.51P/n-GaAs camel-like gate structure for high-breakdown, low-leakage, and high-temperature applications
001E74 (2001-01-15) Temperature Dependence of Gate Current and Breakdown Behaviors in an n+-GaAs/p+-InGaP/n--GaAs High-Barrier Gate Field-Effect Transistor
001F13 (2001) Photonic-sensitive InAlGaAs/InP negative-differential-resistance heterojunction bipolar transistor
001F94 (2000-11) Investigation of mesa-sidewall effects on direct current and radio frequency characteristics of Ga0.51In0.49P/In0.15Ga0.85As/Ga0.51In0.49P pseudomorphic high electron mobility transistors
002031 (2000-03) Characteristics of InGaP/GaAs delta-doped heterojunction bipolar transistor
002150 (1999-12-01) Temperature-dependent characteristics of the inverted delta-doped V-shaped InGaP/InxGa1-xAs/GaAs pseudomorphic transistors
002151 (1999-12-01) Temperature-dependent characteristics of the inverted delta-doped V-shaped InGaP/InxGa1-xAs/GaAs pseudomorphic transistors
002177 (1999-07-26) Applications of an In0.53Ga0.25Al0.22As/InP continuous-conduction-band structure for ultralow current operation transistors
002181 (1999-07-05) Observation of the impulse-like negative-differential resistance of superlatticed resonant-tunneling transistor
002182 (1999-07) Superlatticed negative differential-resistance heterojunction bipolar transistor
002192 (1999-04-12) Application of selective removal of mesa sidewalls for high-breakdown and high-linearity Ga0.51In0.49P/In0.15Ga0.85As pseudomorphic transistors
002193 (1999-04-05) Application of a new airbridge-gate structure for high-performance Ga0.51In0.49P/In0.15Ga0.85As/GaAs pseudomorphic field-effect transistors
002305 (1998-09-07) Application of δ-doped wide-gap collector structure for high-breakdown and low-offset voltage transistors
002649 (1995-07-17) Observation of the anomalous current-voltage characteristics of GaAs/n+-InGaAs/GaAs doped-channel structure
002673 (1995-03-20) Performance enhancement in a metal-insulator-semiconductor-like pseudomorphic transistor by utilizing an n--GaAs/n+-In0.2Ga0.8As two-layer structure
002674 (1995-03-15) Characteristics of a GaAs-InGaAs quantum-well resonant-tunneling switch

List of associated KwdEn.i

Nombre de
documents
Descripteur
21Gallium arsenides
20Experimental study
16Indium compounds
15III-V semiconductors
9Gallium compounds
6Heterojunction bipolar transistors
6Indium arsenides
4Field effect transistors
4High electron mobility transistors
3Aluminium compounds
3IV characteristic
3Leakage currents
3MOCVD
3Phosphorus compounds
3Quantum wells
3Schottky barriers
3Tunnel effect
3semiconductor device breakdown
2Current density
2Electric breakdown
2Electrical conductivity
2Minority carriers
2Resonant tunneling transistors
2Semiconductor device breakdown
2Semiconductor superlattices
2Temperature effects
2Voltage current curve
1Aluminium arsenides
1Arsenic compound
1Binary compound
1Bipolar transistors
1Blocking
1Breakdown point
1Capacitance
1Composite material
1Conduction bands
1Crystal doping
1Current gain
1Direct current
1Doped materials
1Doping profiles
1Electrical characteristic
1Electrical properties
1Electrons
1Experimental result
1Fabrication
1Gallium compound
1Gas sensors
1Heat of adsorption
1Heterostructures
1High-temperature effects
1Hydrogen
1Illumination
1Indium compound
1Indium phosphide
1Instrumentation
1Insulated gate field effect transistors
1Interface states
1Junction gate field effect transistors
1MIS junctions
1Microwave field effect transistors
1Microwave power transistors
1Negative differential conductivity
1Negative resistance devices
1Palladium
1Performance
1Performance evaluation
1Phosphorus compound
1Planar doping
1Platinum
1Power field effect transistors
1Quaternary compound
1Resonance
1Schottky barrier diodes
1Schottky effect
1Semiconductor device measurement
1Semiconductor growth
1Semiconductor heterojunctions
1Semiconductor switches
1Spike potential
1Switching
1Ternary alloys
1Ternary compound
1Transistor collector
1Trapping
1Tunneling
1VPE
1Waveform
1Wide band gap semiconductors
1high-temperature electronics
1low-power electronics

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/Chine/Analysis
HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/Author.i -k "Wen-Chau Liu" 
HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/Author.i  \
                -Sk "Wen-Chau Liu" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/Chine/Analysis/biblio.hfd 

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    Chine
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    Wen-Chau Liu
}}

Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024