Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « WEIBING WU »
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WEIANG LUO < WEIBING WU < WEIBING ZHOU  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
000900 (2011) Effects of Mn substitution on ferro- and piezoelectric properties of Bi0.86SM0.14FeO3 thin films
000E99 (2009) Effects of annealing process and Mn substitution on structure and ferroelectric properties of BiFeO3 films
001156 (2008) Enhanced multiferroic properties of (110)-oriented BiFeO3film deposited on Bi3.5Nd0.5Ti3O12-buffered indium tin oxide/Si substrate
001680 (2006) Characterization of CuInS2 thin films prepared by ion layer gas reaction method
001793 (2005) Influence of post-heat treatment on the properties of CuInS2 thin films deposited by an ion layer gas reaction (ILGAR)
001811 (2005) Growth mechanisms of CuSCN films electrodeposited on ITO in EDTA-chelated copper(II) and KSCN aqueous solution

List of associated KwdEn.i

Nombre de
documents
Descripteur
3Leakage currents
3Thin films
2Coercive force
2Manganese additions
2Organometallic compounds
2Scanning electron microscopy
2Solar cell
2X-ray photoelectron spectra
2XRD
1Absorption coefficient
1Absorption spectra
1Activation energy
1Adhesion
1Alcoholic solution
1Annealing
1Aqueous solution
1Bismuth Iron Oxides Mixed
1Bismuth oxide
1Buffer layer
1Chemical solution
1Copper II Complexes
1Copper Thiocyanates
1Copper sulfide
1Copper sulfides
1Crystallinity
1Dielectric thin films
1Domain structure
1Domain walls
1EDTA
1Electrical properties
1Electrochemical reaction
1Electrodeposition
1Experimental study
1Ferroelectric hysteresis
1Ferroelectric materials
1Ferroelectric thin films
1Ferroic material
1Films
1Glass
1Growth mechanism
1Growth rate
1Hall effect
1Heat treatments
1Indium oxide
1Indium sulfide
1Indium sulfides
1Indium tin oxide electrode
1Inorganic compounds
1Ions
1Iron oxide
1Irreversible processes
1Magnetization
1Metal deposition
1Microstructure
1Optical absorption
1Optical properties
1Piezoelectric properties
1Piezoelectricity
1Polarization
1Polycrystals
1Preferred orientation
1Sol-gel process
1Substrates
1Surface conditions
1Surface treatment
1Temperature
1Texture
1Thin film
1Tin oxide
1Transition element compounds
1Vacancies
1X ray diffraction
1X-ray diffraction analysis

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