Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « PING FAN »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
PING DU < PING FAN < PING GENG  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
000005 (2014) The electrical and optical properties of Cu-doped In2O3 thin films
000370 (2012) The field emission of indium-doped ZnO films fabricated by room temperature DC magnetron sputtering
000535 (2012) Fabrication of Cu(In,Ga)Se2 thin films by ion beam sputtering deposition from a quaternary target at different substrate temperatures
000672 (2011) The influence of annealing temperature on the structural, electrical and optical properties of ion beam sputtered CuInSe2 thin films
000924 (2011) Cu-In-O composite thin films deposited by reactive DC magnetron sputtering
000C33 (2010) Adjustment of the selenium amount during ion beam sputtering deposition of CIS thin films
000C81 (2009) The properties of direct current sputtering deposited InN thin films under different gas flow rates
000F17 (2009) Direct current magnetron sputtering deposition of InN thin films

List of associated KwdEn.i

Nombre de
documents
Descripteur
7Thin films
4Cathode sputtering
4Copper
4Electrical conductivity
4XRD
3Dispersive spectrometry
3Electrical properties
3Ion beam sputtering
3Microstructure
3Preferred orientation
3Scanning electron microscopy
3Semiconductor materials
2Absorption coefficients
2Borosilicate glass
2Chalcopyrite structure
2Copper selenides
2Cubic lattices
2Doping
2Electrical characteristic
2Energy gap
2Indium nitride
2Indium oxide
2Indium selenides
2Ion beam coating
2Optical properties
2Photonic band gap
2Selenium
2Sheet resistivity
2Sputter deposition
2Vacancies
1Absorption spectra
1Acceptor center
1Annealing
1Annealing temperature
1Chalcopyrite
1Chemical composition
1Compensation
1Copper Indium Oxides Mixed
1Copper Indium Selenides Mixed
1Crystallinity
1Current density
1Direct current
1Electron field emission
1Film growth
1Four point probe
1Gallium selenides
1Glass
1Grain size
1Growth mechanism
1Hexagonal lattices
1III-V compound
1Impurity site
1Indium
1Indium additions
1Inorganic compounds
1Ion beam assisted deposition method
1Ion beams
1Magnetrons
1Metal-insulator transition
1Microelectronic fabrication
1Optical characteristic
1Optical constants
1Optimization
1Photoluminescence
1Quaternary compound
1Raman scattering
1Raman spectroscopy
1Reactive sputtering
1Seebeck effect
1Silicon
1Sputtering
1Stoichiometry
1Substitutional impurities
1Substrat temperature
1Surface morphology
1Surface structure
1Temperature dependence
1Temperature effects
1Ternary compounds
1Thermal annealing
1Thin film
1Ultraviolet radiation
1Vacuum chamber
1Work functions
1X ray diffraction
1X ray diffractometry
1Zinc oxide

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/Chine/Analysis
HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/Author.i -k "PING FAN" 
HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/Author.i  \
                -Sk "PING FAN" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/Chine/Analysis/biblio.hfd 

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    Chine
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    PING FAN
}}

Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024