Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « NIEFENG SUN »
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NIANZHU WU < NIEFENG SUN < NILI WANG  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
001111 (2008) Investigation of vacancy defect in InP crystal by positron lifetime measurement
001942 (2004) Study on the perfection of in situ P-injection synthesis LEC-InP single crystals
001991 (2004) Large diameter Sn-doped indium phosphide single crystal growth by LEC method
001995 (2004) Indium phosphide crystal growth from phosphorus-rich melt
001D97 (2002) Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers
001F39 (2001) Hydrogen neutralization effect in bulk N-type LEC InP materials
002101 (2000) H-vacancy complex VInH4 abundance and its influences in n-type LEC InP

List of associated KwdEn.i

Nombre de
documents
Descripteur
5Experimental study
4Crystal growth from melts
4Czochralski method
4Indium phosphides
4Liquid encapsulation
3Hydrogen additions
3Semiconductor materials
2Binary compounds
2Complex defect
2Crystal growth
2Dislocations
2Doped materials
2Electrical conductivity
2III-V compound
2III-V semiconductors
2Impurities
2Iron additions
2Mapping
2Monocrystals
2Photoluminescence
2Scanning electron microscopy
1Annealing
1Carrier density
1Cellular structure
1Chemical etching
1Compensation
1Concentration effect
1Contamination
1Cost lowering
1Crystal defect density
1Crystal defect interaction
1Crystal defects
1Defect states
1Dislocation density
1Doping
1Fourier transformation
1Growth mechanism
1Hall effect
1Illumination
1In situ
1Indium phosphide
1Infrared absorption spectrometry
1Infrared spectra
1Interfaces
1Modulator
1Neutralization
1Optical fiber communication
1Optical telecommunication
1Optimization
1Optimization method
1Optoelectronic device
1P type conductivity
1Photo-induced transient spectroscopy
1Photodetector
1Physical radiation effects
1Polishing
1Polycrystal
1Positron annihilation
1Semiconductor laser
1Semiconductor optical amplifiers
1Sulfur additions
1Temperature gradients
1Thermal annealing
1Thermal decomposition
1Thermal stresses
1Vacancies
1Wafers

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