Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « Jung-Hui Tsai »
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Jung-Chuan Chou < Jung-Hui Tsai < Jung-Ting Chang  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
001A71 (2003-09-29) Multiple negative differential resistance of InP/InGaAs superlattice-emitter resonant-tunneling bipolar transistor at room temperature
001B97 (2003) High performances of InP/InGaAs heterojunction bipolar transistors with a δ-doped sheet between two spacer layers
001E74 (2001-01-15) Temperature Dependence of Gate Current and Breakdown Behaviors in an n+-GaAs/p+-InGaP/n--GaAs High-Barrier Gate Field-Effect Transistor
002163 (1999-10-25) Application of an AlGaAs/GaAs/InGaAs heterostructure emitter for a resonant-tunneling transistor
002182 (1999-07) Superlatticed negative differential-resistance heterojunction bipolar transistor
002649 (1995-07-17) Observation of the anomalous current-voltage characteristics of GaAs/n+-InGaAs/GaAs doped-channel structure
002673 (1995-03-20) Performance enhancement in a metal-insulator-semiconductor-like pseudomorphic transistor by utilizing an n--GaAs/n+-In0.2Ga0.8As two-layer structure
002674 (1995-03-15) Characteristics of a GaAs-InGaAs quantum-well resonant-tunneling switch

List of associated KwdEn.i

Nombre de
documents
Descripteur
8Gallium arsenides
6Experimental study
4Heterojunction bipolar transistors
4Indium arsenides
4Indium compounds
3Field effect transistors
3III-V semiconductors
2Aluminium compounds
2Doped materials
2IV characteristic
2Negative resistance
2Quantum wells
2Resonant tunneling transistors
2Semiconductor superlattices
1Barrier layer
1Base emitter junction
1Binary compound
1Collector
1Current density
1Current gain
1Electric breakdown
1Electrical properties
1Fabrication
1Heterostructures
1High-temperature effects
1Indium phosphide
1Instrumentation
1Leakage currents
1MIS junctions
1MOCVD
1Minority carriers
1Negative resistance devices
1Offset voltage
1Performance
1Performance evaluation
1Phosphorus compounds
1Planar doping
1Resonance
1Room temperature
1Semiconductor device measurement
1Semiconductor growth
1Semiconductor switches
1Spike potential
1Surface recombination
1Temperature effects
1Ternary alloys
1Ternary compound
1Trapping
1Tunnel effect
1Tunnel transistors
1VPE
1low-power electronics
1semiconductor device measurement

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