Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « G. G. Qin »
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G. Fu < G. G. Qin < G. Gao  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
000A52 (2010) Room temperature Er3+ 1.54 μm electroluminescence from Si-rich erbium silicate deposited by magnetron sputtering
000C51 (2010) 1.54-μm electroluminescence from Si-rich erbium silicate
001013 (2008) Synthesis of high quality p-type Zn3P2 nanowires and their application in MISFETs
001613 (2006) Hole-injection mechanisms of organic light emitting diodes with Si anodes
001652 (2006) Effects of resistivity of a p-Si chip on the light-emitting efficiency of a top-emission organic light-emitting diode with the p-Si chip as the anode
001768 (2005) Organic light-emitting diodes with n-type silicon anode
001830 (2005) Effects of In surfactant on the crystalline and photoluminescence properties of GaN nanowires
002654 (1995-07-01) Experimental study on the Er/p-InP Schottky barrier

List of associated KwdEn.i

Nombre de
documents
Descripteur
3Silicon
2Anode
2Charge carrier injection
2Electroluminescence
2Hole
2IV characteristic
2Indium oxide
2Nanowires
2Optoelectronic device
2Organic light emitting diodes
2Photoluminescence
2Thin film
1Ambient temperature
1Amorphous phase
1Annealing
1Bilayers
1CV characteristic
1Carrier mobility
1Cathode
1Cathode sputtering
1Coatings
1Dispersive spectrometry
1Doped materials
1Electrical conductivity
1Electrical measurement
1Electron injection
1Energy transfer
1Erbium
1Erbium Silicates
1Experimental study
1Fermi level
1Field emission microscopy
1Gallium nitrides
1Growth mechanism
1High strength current
1Hole density
1Hole mobility
1III-V semiconductors
1Indium
1Indium phosphide
1Indium phosphides
1Integrated optics
1Light emitting diode
1MESFET
1Metallic thin films
1Microstructure
1Monocrystals
1Nanoelectronics
1Nanomaterial synthesis
1Nanostructured materials
1Nanowire device
1Optoelectronic devices
1Optoelectronics
1P-type conductors
1Performance
1Performance evaluation
1Pinning
1Quinoline derivatives
1RBS
1Scanning electron microscopy
1Schottky barrier diodes
1Semitransparent material
1Silicates
1Silicon oxides
1Thermionic emission
1Thick films
1Thin films
1Threshold voltage
1Tin
1Tin oxide
1Transconductance
1Transmission electron microscopy
1Ultrathin films
1Vapor deposition
1Wafer
1XRD
1n type semiconductor

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