Finlande < France < Grèce

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List of bibliographic references

Number of relevant bibliographic references: 22.
[20-40] [0 - 20][0 - 22]

Ident.	Authors (with country if any)	Title
002633 (1995-11-01)		Critical layer thickness in metal organic chemical vapor deposition grown InGaAs/GaAs strained quantum wells
002726 (1995)		Critical layer thickness in MOCVD grown InGaAs-GaAs strained quantum wells

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List of associated Author.i

Nombre de documents	Descripteur
1	Alain Giraudeau
1	Angélique Simon-Masseron
1	B. Gil
1	Bernard Gil
1	C. Chatillon
1	C. Pautet
1	Christian Coddet
1	Chun-Hao Huang
1	Delphine Schaming
1	Gérald Chaplais
1	Gérard Nouet
1	HANLIN LIAO
1	HUAPING LEI
1	I. Ansara
1	Iftikhar Ahmed
1	J-L. Leclercq
1	J. Ebothe
1	J. Ledieu
1	J. P. Moy
1	JIAN HAO
1	JIE HU
1	JUN CHEN
1	JUNFENG HAN
1	Jacques Graffeuil
1	Jean-Louis Marty
1	Joël Patarin
1	Jun-Feng Han
1	K. Laurent
1	K. Sun
1	L. Nzoghe-Mendome
1	LEI WU
1	Laurent Escotte
1	Laurent Ruhlmann
1	M. Garrigues
1	M.-P. Besland
1	Michel Goldmann
1	O. Briot
1	Oleg I. Lebedev
1	Olivier Briot
1	P. Caroff
1	P. Regreny
1	P. Viktorovitch
1	Philippe Boullay
1	Pierre Audebert
1	R. Aulombard
1	Rana Farha
1	Roger Aulombard
1	S. Cortial
1	Thien-Phap Nguyen
1	V. Fournee
1	Valérie Alain-Rizzo
1	Wilfrid Prellier
1	X. Hugon
1	Y. Leprince-Wang
1	YING WANG
1	YONG CHEN

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