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Electrical properties of stacking electrodes for flexible crystalline semiconductor photonic devices

Identifieur interne : 000891 ( Chine/Analysis ); précédent : 000890; suivant : 000892

Electrical properties of stacking electrodes for flexible crystalline semiconductor photonic devices

Auteurs : RBID : Pascal:11-0458171

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Abstract

We report here electrical properties of low-temperature-stacked electrodes for large-area flexible photonic devices, based on single-crystalline InP nanomembrane (NM) transfer and stacking processes. Au, Al and ITO electrodes were investigated. An excellent ohmic contact was demonstrated on the stacked InP NM-ITO electrode, with a measured contact resistivity of 0.45 Ω cm2. Two types of flexible InP solar cells were also fabricated and characterized, based on the stacked InP NM-ITO and InP NM-Al contacts, respectively. The efficiency of solar cells with ITO as back contact is five times higher than that with Al as back contact. Such low-temperature energy-efficient NM transfer and electrode-stacking techniques can be applied to a wide range of flexible thin film photonic devices.

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<div type="abstract" xml:lang="en">We report here electrical properties of low-temperature-stacked electrodes for large-area flexible photonic devices, based on single-crystalline InP nanomembrane (NM) transfer and stacking processes. Au, Al and ITO electrodes were investigated. An excellent ohmic contact was demonstrated on the stacked InP NM-ITO electrode, with a measured contact resistivity of 0.45 Ω cm
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