Auteurs
Keywords (en)
Analysis
Chine
Racine
Analysis
Chine
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Racine
Racine

Serveur d'exploration sur l'Indium

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Eléments de l'association

ZHIMING LI9
XRD449
ZHIMING LI Sauf XRD" 3
XRD Sauf ZHIMING LI" 443
ZHIMING LI Et XRD 6
ZHIMING LI Ou XRD 452
Corpus4194
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List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
000808 Influence of buffer layer thickness and epilayer's growth temperature on crystalline quality of InAs0.6P0.4/InP grown by LP-MOCVD
000907 Effect of buffer layer annealing temperature on the crystalline quality of In0.82Ga0.18As layers grown by two-step growth method
000C01 Effect of epilayer's growth temperature on crystalline quality of In As0.6P0.4/InP grown by two-step growth method
000F05 Effect of buffer thickness on properties of In0.8Ga0.2As/InP with two-step growth technique
000F62 A study of two-step growth and properties of In0.82Ga0.18As on InP
001187 Effect of buffer growth temperature on crystalline quality and optical property of In0.82Ga0.18As/InP grown by LP-MOCVD
Wicri

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