Eléments de l'association
| ![]() |
List of bibliographic references
Number of relevant bibliographic references: 1.Ident. | Authors (with country if any) | Title |
---|---|---|
001E74 | Temperature Dependence of Gate Current and Breakdown Behaviors in an n+-GaAs/p+-InGaP/n--GaAs High-Barrier Gate Field-Effect Transistor |
![]() | This area was generated with Dilib version V0.5.77. | ![]() |