Serveur d'exploration sur l'Indium

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Electron diffraction And NotJUN ZHANG

List of bibliographic references

Number of relevant bibliographic references: 20.
Ident.Authors (with country if any)Title
000465 Microstructural characterization of Cu-poor Cu (In, Ga)Se2 surface layer
000D05 Synthesis of CuInSe2 and CuGaSe2 Hexagonal Microplates in Oleic Acid and Oleylamine Mixture
000D11 Synthesis and characterization of In2S3 nanoparticles
000E17 Ir(ppy)3 phosphorescent microrods and nanowires : promising micro-phosphors
000E47 Growth of One-Dimensional Hierarchical Multilayered Indium Nanostructures
001080 One-Step Aqueous Solvothermal Synthesis of In2O3Nanocrystals
001193 Direct observation of MoO2 crystal growth from amorphous MoO3 film
001800 In situ revelation of a zinc-blende InN wetting layer during Stranski-Krastanov growth on GaN(0001) by molecular-beam epitaxy
001826 Electrochemical deposition and characterization of wide band semiconductor ZnO thin film
001875 Chemistry-mediated two-dimensional to three-dimensional transition of In thin films
001932 The 2/1 cubic approximant of the Ag42In42Ca16 icosahedral quasicrystal
001935 Synthesis of metastable hexagonal In2O3 nanocrystals by a precursor-dehydration route under ambient pressure
001939 Synthesis and Characterization of Single-Crystalline In2O 3 Nanocrystals via Solution Dispersion
001D35 Structural, optical, and electrical properties of indium tin oxide films with corundum structure fabricated by a sol-gel route based on solvothermal reactions
001D75 Fabrication and characterization of In2O3 nanowires
001E89 Synthesis and characterization of ternary CuInS2 nanorods via a hydrothermal route
001F74 An effective way to detect the secondary phase in Sr-doped LaInO3
002130 Cross-sectional high-resolution transmission electron microscopy of the microstructure of electrochromic nickel oxide
002886 Characterization of InxGa1-xAs/GaAs strained-layer superlattices by transmission electron microscopy and convergent beam electron diffraction
002933 Convergent beam electron diffraction study of lattice distortion in InGaAs/GaAs strained-layer superlattices grown by metalorganic chemical vapor deposition

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