Correlation of GMR with texture and interfacial roughness in optimized rf sputtering deposited Co/Cu multilayers
Identifieur interne :
000368 ( PascalFrancis/Curation );
précédent :
000367;
suivant :
000369
Correlation of GMR with texture and interfacial roughness in optimized rf sputtering deposited Co/Cu multilayers
Auteurs : J. Ben Youssef [
France,
Maroc] ;
K. Bouziane [
France] ;
O. Koshkina [
France] ;
H. Le Gall [
France] ;
M. El Harfaoui [
Maroc] ;
M. El Yamani [
Maroc] ;
J. M. Desvignes [
France] ;
A. Fert [
France]
Source :
-
Journal of magnetism and magnetic materials [ 0304-8853 ] ; 1997.
RBID : Pascal:97-0157111
Descripteurs français
- Pascal (Inist)
- Magnétorésistance géante,
Texture,
Rugosité,
Interface solide solide,
Multicouche,
XRD,
Résonance antiferromagnétique,
Effet dimensionnel,
Epaisseur,
Etude expérimentale,
Oscillation,
Préparation,
Pulvérisation haute fréquence,
Cobalt,
Cuivre,
7570P,
6835C,
Co,
Cu.
- Wicri :
English descriptors
- KwdEn :
- Antiferromagnetic resonance,
Cobalt,
Copper,
Experimental study,
Giant magnetoresistance,
Multilayers,
Oscillations,
Preparation,
Radiofrequency sputtering,
Roughness,
Size effect,
Solid-solid interfaces,
Texture,
Thickness,
XRD.
Abstract
Copyright (c) 1996 Elsevier Science B.V. All rights reserved. The objectives of the present work were two fold: first to obtain the highest giant magnetoresistance (GMR) ratio in Co/Cu multilayers grown from the unusual process of rf diode sputtering and second, to investigate in detail correlation between GMR and texture and the interfacial roughness deduced from X-ray diffraction and AFM, respectively. Different interface structures have been induced from the change of the sputtering parameters (sputtering argon gas pressure PAr) which gave the optimal rf sputtering conditions for high GMR. From different results it is concluded that the most important parameter is interface roughness which induces a strong effect on both the GMR and the resistivity of the superlattice. A change in the tCo2 dependence of the reciprocal resistance near tCo=25 Å is attributed to an increase of the effect of the layer roughness when the tCo is going from mesoscopic (tCo>25 Å) to nanoscopic scale (tCo<25 Å).
| pA |
| A01 | 01 | 1 | | @0 0304-8853 |
|---|
| A02 | 01 | | | @0 JMMMDC |
|---|
| A03 | | 1 | | @0 J. magn. magn. mater. |
|---|
| A05 | | | | @2 165 |
|---|
| A06 | | | | @2 1-3 |
|---|
| A08 | 01 | 1 | ENG | @1 Correlation of GMR with texture and interfacial roughness in optimized rf sputtering deposited Co/Cu multilayers |
|---|
| A11 | 01 | 1 | | @1 BEN YOUSSEF (J.) |
|---|
| A11 | 02 | 1 | | @1 BOUZIANE (K.) |
|---|
| A11 | 03 | 1 | | @1 KOSHKINA (O.) |
|---|
| A11 | 04 | 1 | | @1 LE GALL (H.) |
|---|
| A11 | 05 | 1 | | @1 EL HARFAOUI (M.) |
|---|
| A11 | 06 | 1 | | @1 EL YAMANI (M.) |
|---|
| A11 | 07 | 1 | | @1 DESVIGNES (J. M.) |
|---|
| A11 | 08 | 1 | | @1 FERT (A.) |
|---|
| A14 | 01 | | | @2 92195 Meudon-Bellevue @3 FRA @Z 1 aut. @Z 2 aut. @Z 3 aut. @Z 4 aut. @Z 7 aut. |
|---|
| A14 | 02 | | | @2 Rabat @3 MAR @Z 1 aut. @Z 6 aut. |
|---|
| A14 | 03 | | | @2 Rabat @3 MAR @Z 5 aut. |
|---|
| A14 | 04 | | | @2 91404 Orsay @3 FRA @Z 8 aut. |
|---|
| A20 | | | | @1 288-291 |
|---|
| A21 | | | | @1 1997 |
|---|
| A23 | 01 | | | @0 ENG |
|---|
| A24 | 01 | | | @0 eng |
|---|
| A43 | 01 | | | @1 INIST @2 17230 @5 354000063124420138 |
|---|
| A44 | | | | @0 9000 @1 © 1997 Elsevier Science B.V. All rights reserved. |
|---|
| A47 | 01 | 1 | | @0 97-0157111 |
|---|
| A60 | | | | @1 P @2 C |
|---|
| A61 | | | | @0 A |
|---|
| A64 | 01 | 1 | | @0 Journal of magnetism and magnetic materials |
|---|
| A66 | 01 | | | @0 NLD |
|---|
| C01 | 01 | | ENG | @0 Copyright (c) 1996 Elsevier Science B.V. All rights reserved. The objectives of the present work were two fold: first to obtain the highest giant magnetoresistance (GMR) ratio in Co/Cu multilayers grown from the unusual process of rf diode sputtering and second, to investigate in detail correlation between GMR and texture and the interfacial roughness deduced from X-ray diffraction and AFM, respectively. Different interface structures have been induced from the change of the sputtering parameters (sputtering argon gas pressure PAr) which gave the optimal rf sputtering conditions for high GMR. From different results it is concluded that the most important parameter is interface roughness which induces a strong effect on both the GMR and the resistivity of the superlattice. A change in the tCo2 dependence of the reciprocal resistance near tCo=25 Å is attributed to an increase of the effect of the layer roughness when the tCo is going from mesoscopic (tCo>25 Å) to nanoscopic scale (tCo<25 Å). |
|---|
| C02 | 01 | 3 | | @0 001B70E70P |
|---|
| C02 | 02 | 3 | | @0 001B60H35C |
|---|
| C02 | 03 | X | | @0 240 |
|---|
| C03 | 01 | 3 | FRE | @0 Magnétorésistance géante @5 01 |
|---|
| C03 | 01 | 3 | ENG | @0 Giant magnetoresistance @5 01 |
|---|
| C03 | 02 | 3 | FRE | @0 Texture @5 02 |
|---|
| C03 | 02 | 3 | ENG | @0 Texture @5 02 |
|---|
| C03 | 03 | 3 | FRE | @0 Rugosité @5 03 |
|---|
| C03 | 03 | 3 | ENG | @0 Roughness @5 03 |
|---|
| C03 | 04 | 3 | FRE | @0 Interface solide solide @5 04 |
|---|
| C03 | 04 | 3 | ENG | @0 Solid-solid interfaces @5 04 |
|---|
| C03 | 05 | 3 | FRE | @0 Multicouche @5 05 |
|---|
| C03 | 05 | 3 | ENG | @0 Multilayers @5 05 |
|---|
| C03 | 06 | 3 | FRE | @0 XRD @5 06 |
|---|
| C03 | 06 | 3 | ENG | @0 XRD @5 06 |
|---|
| C03 | 07 | 3 | FRE | @0 Résonance antiferromagnétique @5 07 |
|---|
| C03 | 07 | 3 | ENG | @0 Antiferromagnetic resonance @5 07 |
|---|
| C03 | 08 | 3 | FRE | @0 Effet dimensionnel @5 08 |
|---|
| C03 | 08 | 3 | ENG | @0 Size effect @5 08 |
|---|
| C03 | 09 | 3 | FRE | @0 Epaisseur @5 09 |
|---|
| C03 | 09 | 3 | ENG | @0 Thickness @5 09 |
|---|
| C03 | 10 | 3 | FRE | @0 Etude expérimentale @5 10 |
|---|
| C03 | 10 | 3 | ENG | @0 Experimental study @5 10 |
|---|
| C03 | 11 | 3 | FRE | @0 Oscillation @5 11 |
|---|
| C03 | 11 | 3 | ENG | @0 Oscillations @5 11 |
|---|
| C03 | 12 | X | FRE | @0 Préparation @5 12 |
|---|
| C03 | 12 | X | ENG | @0 Preparation @5 12 |
|---|
| C03 | 12 | X | GER | @0 Vorbereitung @5 12 |
|---|
| C03 | 12 | X | SPA | @0 Preparación @5 12 |
|---|
| C03 | 13 | X | FRE | @0 Pulvérisation haute fréquence @5 13 |
|---|
| C03 | 13 | X | ENG | @0 Radiofrequency sputtering @5 13 |
|---|
| C03 | 13 | X | SPA | @0 Pulverización alta frecuencia @5 13 |
|---|
| C03 | 14 | 3 | FRE | @0 Cobalt @2 NC @5 14 |
|---|
| C03 | 14 | 3 | ENG | @0 Cobalt @2 NC @5 14 |
|---|
| C03 | 15 | 3 | FRE | @0 Cuivre @2 NC @5 15 |
|---|
| C03 | 15 | 3 | ENG | @0 Copper @2 NC @5 15 |
|---|
| C03 | 16 | 3 | FRE | @0 7570P @2 PAC @4 INC @5 56 |
|---|
| C03 | 17 | 3 | FRE | @0 6835C @2 PAC @4 INC @5 57 |
|---|
| C03 | 18 | 3 | FRE | @0 Co @4 INC @5 92 |
|---|
| C03 | 19 | 3 | FRE | @0 Cu @4 INC @5 93 |
|---|
| C07 | 01 | 3 | FRE | @0 Métal transition @5 16 |
|---|
| C07 | 01 | 3 | ENG | @0 Transition elements @5 16 |
|---|
| N21 | | | | @1 069 |
|---|
|
|---|
| pR |
| A30 | 01 | 1 | ENG | @1 EMRS-E : EMRS-E Symp. Magn. Ultrahin Films, Multilayers & Surfaces @3 Strasbourg @4 1996-06-07 |
|---|
|
|---|
Links toward previous steps (curation, corpus...)
- to stream PascalFrancis, to step Corpus: Pour aller vers cette notice dans l'étape Curation :000335
Links to Exploration step
Pascal:97-0157111
Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Correlation of GMR with texture and interfacial roughness in optimized rf sputtering deposited Co/Cu multilayers</title>
<author><name sortKey="Ben Youssef, J" sort="Ben Youssef, J" uniqKey="Ben Youssef J" first="J." last="Ben Youssef">J. Ben Youssef</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s2>92195 Meudon-Bellevue</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><affiliation wicri:level="1"><inist:fA14 i1="02"><s2>Rabat</s2>
<s3>MAR</s3>
<sZ>1 aut.</sZ>
<sZ>6 aut.</sZ>
</inist:fA14><country>Maroc</country>
</affiliation><author><name sortKey="Bouziane, K" sort="Bouziane, K" uniqKey="Bouziane K" first="K." last="Bouziane">K. Bouziane</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s2>92195 Meudon-Bellevue</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><author><name sortKey="Koshkina, O" sort="Koshkina, O" uniqKey="Koshkina O" first="O." last="Koshkina">O. Koshkina</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s2>92195 Meudon-Bellevue</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><author><name sortKey="Le Gall, H" sort="Le Gall, H" uniqKey="Le Gall H" first="H." last="Le Gall">H. Le Gall</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s2>92195 Meudon-Bellevue</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><author><name sortKey="El Harfaoui, M" sort="El Harfaoui, M" uniqKey="El Harfaoui M" first="M." last="El Harfaoui">M. El Harfaoui</name>
<affiliation wicri:level="1"><inist:fA14 i1="03"><s2>Rabat</s2>
<s3>MAR</s3>
<sZ>5 aut.</sZ>
</inist:fA14><country>Maroc</country>
</affiliation><author><name sortKey="El Yamani, M" sort="El Yamani, M" uniqKey="El Yamani M" first="M." last="El Yamani">M. El Yamani</name>
<affiliation wicri:level="1"><inist:fA14 i1="02"><s2>Rabat</s2>
<s3>MAR</s3>
<sZ>1 aut.</sZ>
<sZ>6 aut.</sZ>
</inist:fA14><country>Maroc</country>
</affiliation><author><name sortKey="Desvignes, J M" sort="Desvignes, J M" uniqKey="Desvignes J" first="J. M." last="Desvignes">J. M. Desvignes</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s2>92195 Meudon-Bellevue</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><author><name sortKey="Fert, A" sort="Fert, A" uniqKey="Fert A" first="A." last="Fert">A. Fert</name>
<affiliation wicri:level="1"><inist:fA14 i1="04"><s2>91404 Orsay</s2>
<s3>FRA</s3>
<sZ>8 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><publicationStmt><idno type="wicri:source">INIST</idno>
<idno type="inist">97-0157111</idno>
<date when="1997">1997</date>
<idno type="stanalyst">PASCAL 97-0157111 Elsevier</idno>
<idno type="RBID">Pascal:97-0157111</idno>
<idno type="wicri:Area/PascalFrancis/Corpus">000335</idno>
<idno type="wicri:Area/PascalFrancis/Curation">000368</idno>
</publicationStmt><sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">Correlation of GMR with texture and interfacial roughness in optimized rf sputtering deposited Co/Cu multilayers</title>
<author><name sortKey="Ben Youssef, J" sort="Ben Youssef, J" uniqKey="Ben Youssef J" first="J." last="Ben Youssef">J. Ben Youssef</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s2>92195 Meudon-Bellevue</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><affiliation wicri:level="1"><inist:fA14 i1="02"><s2>Rabat</s2>
<s3>MAR</s3>
<sZ>1 aut.</sZ>
<sZ>6 aut.</sZ>
</inist:fA14><country>Maroc</country>
</affiliation><author><name sortKey="Bouziane, K" sort="Bouziane, K" uniqKey="Bouziane K" first="K." last="Bouziane">K. Bouziane</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s2>92195 Meudon-Bellevue</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><author><name sortKey="Koshkina, O" sort="Koshkina, O" uniqKey="Koshkina O" first="O." last="Koshkina">O. Koshkina</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s2>92195 Meudon-Bellevue</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><author><name sortKey="Le Gall, H" sort="Le Gall, H" uniqKey="Le Gall H" first="H." last="Le Gall">H. Le Gall</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s2>92195 Meudon-Bellevue</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><author><name sortKey="El Harfaoui, M" sort="El Harfaoui, M" uniqKey="El Harfaoui M" first="M." last="El Harfaoui">M. El Harfaoui</name>
<affiliation wicri:level="1"><inist:fA14 i1="03"><s2>Rabat</s2>
<s3>MAR</s3>
<sZ>5 aut.</sZ>
</inist:fA14><country>Maroc</country>
</affiliation><author><name sortKey="El Yamani, M" sort="El Yamani, M" uniqKey="El Yamani M" first="M." last="El Yamani">M. El Yamani</name>
<affiliation wicri:level="1"><inist:fA14 i1="02"><s2>Rabat</s2>
<s3>MAR</s3>
<sZ>1 aut.</sZ>
<sZ>6 aut.</sZ>
</inist:fA14><country>Maroc</country>
</affiliation><author><name sortKey="Desvignes, J M" sort="Desvignes, J M" uniqKey="Desvignes J" first="J. M." last="Desvignes">J. M. Desvignes</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s2>92195 Meudon-Bellevue</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><author><name sortKey="Fert, A" sort="Fert, A" uniqKey="Fert A" first="A." last="Fert">A. Fert</name>
<affiliation wicri:level="1"><inist:fA14 i1="04"><s2>91404 Orsay</s2>
<s3>FRA</s3>
<sZ>8 aut.</sZ>
</inist:fA14><country>France</country>
</affiliation><series><title level="j" type="main">Journal of magnetism and magnetic materials</title>
<title level="j" type="abbreviated">J. magn. magn. mater.</title>
<idno type="ISSN">0304-8853</idno>
<imprint><date when="1997">1997</date>
</imprint><seriesStmt><title level="j" type="main">Journal of magnetism and magnetic materials</title>
<title level="j" type="abbreviated">J. magn. magn. mater.</title>
<idno type="ISSN">0304-8853</idno>
</seriesStmt><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Antiferromagnetic resonance</term>
<term>Cobalt</term>
<term>Copper</term>
<term>Experimental study</term>
<term>Giant magnetoresistance</term>
<term>Multilayers</term>
<term>Oscillations</term>
<term>Preparation</term>
<term>Radiofrequency sputtering</term>
<term>Roughness</term>
<term>Size effect</term>
<term>Solid-solid interfaces</term>
<term>Texture</term>
<term>Thickness</term>
<term>XRD</term>
</keywords><keywords scheme="Pascal" xml:lang="fr"><term>Magnétorésistance géante</term>
<term>Texture</term>
<term>Rugosité</term>
<term>Interface solide solide</term>
<term>Multicouche</term>
<term>XRD</term>
<term>Résonance antiferromagnétique</term>
<term>Effet dimensionnel</term>
<term>Epaisseur</term>
<term>Etude expérimentale</term>
<term>Oscillation</term>
<term>Préparation</term>
<term>Pulvérisation haute fréquence</term>
<term>Cobalt</term>
<term>Cuivre</term>
<term>7570P</term>
<term>6835C</term>
<term>Co</term>
<term>Cu</term>
</keywords><keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Cobalt</term>
<term>Cuivre</term>
</keywords><front><div type="abstract" xml:lang="en">Copyright (c) 1996 Elsevier Science B.V. All rights reserved. The objectives of the present work were two fold: first to obtain the highest giant magnetoresistance (GMR) ratio in Co/Cu multilayers grown from the unusual process of rf diode sputtering and second, to investigate in detail correlation between GMR and texture and the interfacial roughness deduced from X-ray diffraction and AFM, respectively. Different interface structures have been induced from the change of the sputtering parameters (sputtering argon gas pressure P<sub>Ar</sub>
) which gave the optimal rf sputtering conditions for high GMR. From different results it is concluded that the most important parameter is interface roughness which induces a strong effect on both the GMR and the resistivity of the superlattice. A change in the t<sub>Co</sub>
<sup>2</sup>
dependence of the reciprocal resistance near t<sub>Co</sub>
=25 Å is attributed to an increase of the effect of the layer roughness when the t<sub>Co</sub>
is going from mesoscopic (t<sub>Co</sub>
>25 Å) to nanoscopic scale (t<sub>Co</sub>
<25 Å).</div><inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0304-8853</s0>
</fA01><fA02 i1="01"><s0>JMMMDC</s0>
</fA02><fA03 i2="1"><s0>J. magn. magn. mater.</s0>
</fA03><fA05><s2>165</s2>
</fA05><fA06><s2>1-3</s2>
</fA06><fA08 i1="01" i2="1" l="ENG"><s1>Correlation of GMR with texture and interfacial roughness in optimized rf sputtering deposited Co/Cu multilayers</s1>
</fA08><fA11 i1="01" i2="1"><s1>BEN YOUSSEF (J.)</s1>
</fA11><fA11 i1="02" i2="1"><s1>BOUZIANE (K.)</s1>
</fA11><fA11 i1="03" i2="1"><s1>KOSHKINA (O.)</s1>
</fA11><fA11 i1="04" i2="1"><s1>LE GALL (H.)</s1>
</fA11><fA11 i1="05" i2="1"><s1>EL HARFAOUI (M.)</s1>
</fA11><fA11 i1="06" i2="1"><s1>EL YAMANI (M.)</s1>
</fA11><fA11 i1="07" i2="1"><s1>DESVIGNES (J. M.)</s1>
</fA11><fA11 i1="08" i2="1"><s1>FERT (A.)</s1>
</fA11><fA14 i1="01"><s2>92195 Meudon-Bellevue</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>7 aut.</sZ>
</fA14><fA14 i1="02"><s2>Rabat</s2>
<s3>MAR</s3>
<sZ>1 aut.</sZ>
<sZ>6 aut.</sZ>
</fA14><fA14 i1="03"><s2>Rabat</s2>
<s3>MAR</s3>
<sZ>5 aut.</sZ>
</fA14><fA14 i1="04"><s2>91404 Orsay</s2>
<s3>FRA</s3>
<sZ>8 aut.</sZ>
</fA14><fA20><s1>288-291</s1>
</fA20><fA21><s1>1997</s1>
</fA21><fA23 i1="01"><s0>ENG</s0>
</fA23><fA24 i1="01"><s0>eng</s0>
</fA24><fA43 i1="01"><s1>INIST</s1>
<s2>17230</s2>
<s5>354000063124420138</s5>
</fA43><fA44><s0>9000</s0>
<s1>© 1997 Elsevier Science B.V. All rights reserved.</s1>
</fA44><fA47 i1="01" i2="1"><s0>97-0157111</s0>
</fA47><fA60><s1>P</s1>
<s2>C</s2>
</fA60><fA64 i1="01" i2="1"><s0>Journal of magnetism and magnetic materials</s0>
</fA64><fA66 i1="01"><s0>NLD</s0>
</fA66><fC01 i1="01" l="ENG"><s0>Copyright (c) 1996 Elsevier Science B.V. All rights reserved. The objectives of the present work were two fold: first to obtain the highest giant magnetoresistance (GMR) ratio in Co/Cu multilayers grown from the unusual process of rf diode sputtering and second, to investigate in detail correlation between GMR and texture and the interfacial roughness deduced from X-ray diffraction and AFM, respectively. Different interface structures have been induced from the change of the sputtering parameters (sputtering argon gas pressure P<sub>Ar</sub>
) which gave the optimal rf sputtering conditions for high GMR. From different results it is concluded that the most important parameter is interface roughness which induces a strong effect on both the GMR and the resistivity of the superlattice. A change in the t<sub>Co</sub>
<sup>2</sup>
dependence of the reciprocal resistance near t<sub>Co</sub>
=25 Å is attributed to an increase of the effect of the layer roughness when the t<sub>Co</sub>
is going from mesoscopic (t<sub>Co</sub>
>25 Å) to nanoscopic scale (t<sub>Co</sub>
<25 Å).</s0><fC02 i1="01" i2="3"><s0>001B70E70P</s0>
</fC02><fC02 i1="02" i2="3"><s0>001B60H35C</s0>
</fC02><fC02 i1="03" i2="X"><s0>240</s0>
</fC02><fC03 i1="01" i2="3" l="FRE"><s0>Magnétorésistance géante</s0>
<s5>01</s5>
</fC03><fC03 i1="01" i2="3" l="ENG"><s0>Giant magnetoresistance</s0>
<s5>01</s5>
</fC03><fC03 i1="02" i2="3" l="FRE"><s0>Texture</s0>
<s5>02</s5>
</fC03><fC03 i1="02" i2="3" l="ENG"><s0>Texture</s0>
<s5>02</s5>
</fC03><fC03 i1="03" i2="3" l="FRE"><s0>Rugosité</s0>
<s5>03</s5>
</fC03><fC03 i1="03" i2="3" l="ENG"><s0>Roughness</s0>
<s5>03</s5>
</fC03><fC03 i1="04" i2="3" l="FRE"><s0>Interface solide solide</s0>
<s5>04</s5>
</fC03><fC03 i1="04" i2="3" l="ENG"><s0>Solid-solid interfaces</s0>
<s5>04</s5>
</fC03><fC03 i1="05" i2="3" l="FRE"><s0>Multicouche</s0>
<s5>05</s5>
</fC03><fC03 i1="05" i2="3" l="ENG"><s0>Multilayers</s0>
<s5>05</s5>
</fC03><fC03 i1="06" i2="3" l="FRE"><s0>XRD</s0>
<s5>06</s5>
</fC03><fC03 i1="06" i2="3" l="ENG"><s0>XRD</s0>
<s5>06</s5>
</fC03><fC03 i1="07" i2="3" l="FRE"><s0>Résonance antiferromagnétique</s0>
<s5>07</s5>
</fC03><fC03 i1="07" i2="3" l="ENG"><s0>Antiferromagnetic resonance</s0>
<s5>07</s5>
</fC03><fC03 i1="08" i2="3" l="FRE"><s0>Effet dimensionnel</s0>
<s5>08</s5>
</fC03><fC03 i1="08" i2="3" l="ENG"><s0>Size effect</s0>
<s5>08</s5>
</fC03><fC03 i1="09" i2="3" l="FRE"><s0>Epaisseur</s0>
<s5>09</s5>
</fC03><fC03 i1="09" i2="3" l="ENG"><s0>Thickness</s0>
<s5>09</s5>
</fC03><fC03 i1="10" i2="3" l="FRE"><s0>Etude expérimentale</s0>
<s5>10</s5>
</fC03><fC03 i1="10" i2="3" l="ENG"><s0>Experimental study</s0>
<s5>10</s5>
</fC03><fC03 i1="11" i2="3" l="FRE"><s0>Oscillation</s0>
<s5>11</s5>
</fC03><fC03 i1="11" i2="3" l="ENG"><s0>Oscillations</s0>
<s5>11</s5>
</fC03><fC03 i1="12" i2="X" l="FRE"><s0>Préparation</s0>
<s5>12</s5>
</fC03><fC03 i1="12" i2="X" l="ENG"><s0>Preparation</s0>
<s5>12</s5>
</fC03><fC03 i1="12" i2="X" l="GER"><s0>Vorbereitung</s0>
<s5>12</s5>
</fC03><fC03 i1="12" i2="X" l="SPA"><s0>Preparación</s0>
<s5>12</s5>
</fC03><fC03 i1="13" i2="X" l="FRE"><s0>Pulvérisation haute fréquence</s0>
<s5>13</s5>
</fC03><fC03 i1="13" i2="X" l="ENG"><s0>Radiofrequency sputtering</s0>
<s5>13</s5>
</fC03><fC03 i1="13" i2="X" l="SPA"><s0>Pulverización alta frecuencia</s0>
<s5>13</s5>
</fC03><fC03 i1="14" i2="3" l="FRE"><s0>Cobalt</s0>
<s2>NC</s2>
<s5>14</s5>
</fC03><fC03 i1="14" i2="3" l="ENG"><s0>Cobalt</s0>
<s2>NC</s2>
<s5>14</s5>
</fC03><fC03 i1="15" i2="3" l="FRE"><s0>Cuivre</s0>
<s2>NC</s2>
<s5>15</s5>
</fC03><fC03 i1="15" i2="3" l="ENG"><s0>Copper</s0>
<s2>NC</s2>
<s5>15</s5>
</fC03><fC03 i1="16" i2="3" l="FRE"><s0>7570P</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>56</s5>
</fC03><fC03 i1="17" i2="3" l="FRE"><s0>6835C</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>57</s5>
</fC03><fC03 i1="18" i2="3" l="FRE"><s0>Co</s0>
<s4>INC</s4>
<s5>92</s5>
</fC03><fC03 i1="19" i2="3" l="FRE"><s0>Cu</s0>
<s4>INC</s4>
<s5>93</s5>
</fC03><fC07 i1="01" i2="3" l="FRE"><s0>Métal transition</s0>
<s5>16</s5>
</fC07><fC07 i1="01" i2="3" l="ENG"><s0>Transition elements</s0>
<s5>16</s5>
</fC07><fN21><s1>069</s1>
</fN21><pR><fA30 i1="01" i2="1" l="ENG"><s1>EMRS-E : EMRS-E Symp. Magn. Ultrahin Films, Multilayers & Surfaces</s1>
<s3>Strasbourg</s3>
<s4>1996-06-07</s4>
</fA30>
Pour manipuler ce document sous Unix (Dilib)
EXPLOR_STEP=$WICRI_ROOT/Wicri/Terre/explor/CobaltMaghrebV1/Data/PascalFrancis/Curation
HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 000368 | SxmlIndent | more
Ou
HfdSelect -h $EXPLOR_AREA/Data/PascalFrancis/Curation/biblio.hfd -nk 000368 | SxmlIndent | more
Pour mettre un lien sur cette page dans le réseau Wicri
{{Explor lien
|wiki= Wicri/Terre
|area= CobaltMaghrebV1
|flux= PascalFrancis
|étape= Curation
|type= RBID
|clé= Pascal:97-0157111
|texte= Correlation of GMR with texture and interfacial roughness in optimized rf sputtering deposited Co/Cu multilayers
}}
| This area was generated with Dilib version V0.6.32.
Data generation: Tue Nov 14 12:56:51 2017. Site generation: Mon Feb 12 07:59:49 2024 |  |
