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Effects of interfacial roughness on the magnetoresistance of Co/Cu multilayers

Identifieur interne : 000100 ( PascalFrancis/Corpus ); précédent : 000099; suivant : 000101

Effects of interfacial roughness on the magnetoresistance of Co/Cu multilayers

Auteurs : F. Trigui ; B. Elsafi ; Z. Fakhfakh ; P. Beauvillain

Source :

RBID : Pascal:10-0168545

Descripteurs français

English descriptors

Abstract

Using a semi-classical approach, Hood, Falicov and Penn have studied the effects of interfacial roughness on the magnetoresistance (MR) of iron based trilayers (Fe/Cr/Fe and Fe/Cu/Fe). We extend their theory to magnetic metallic multilayers composed of N bilayers ferromagnetic-normal metal. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The averaged effects due to impurities, interdiffusion, band structure, etc. are included in a simple way using two phenomenological parameters S↑ and S↓ for two directions of spin. MR variation with S↑, S↓ and relaxation time is reported. We analyse also recent experimental data giving the influence of number of bilayers on the MR of Co/Cu multilayers for different temperatures.

Notice en format standard (ISO 2709)

Pour connaître la documentation sur le format Inist Standard.

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A01 01  1    @0 0304-8853
A02 01      @0 JMMMDC
A03   1    @0 J. magn. magn. mater.
A05       @2 322
A06       @2 6
A08 01  1  ENG  @1 Effects of interfacial roughness on the magnetoresistance of Co/Cu multilayers
A11 01  1    @1 TRIGUI (F.)
A11 02  1    @1 ELSAFI (B.)
A11 03  1    @1 FAKHFAKH (Z.)
A11 04  1    @1 BEAUVILLAIN (P.)
A14 01      @1 Lamacop, Department of physics, Faculté des Sciences de Sfax, University of sfax, route Soukra km3.5, B.P 1071 @2 3000 Sfax @3 TUN @Z 1 aut. @Z 2 aut. @Z 3 aut.
A14 02      @1 Institut d'Electronique Fondamentale, Bât 220 Université Paris sud @2 91405 Orsay @3 FRA @Z 4 aut.
A20       @1 596-602
A21       @1 2010
A23 01      @0 ENG
A43 01      @1 INIST @2 17230 @5 354000181677350050
A44       @0 0000 @1 © 2010 INIST-CNRS. All rights reserved.
A45       @0 19 ref.
A47 01  1    @0 10-0168545
A60       @1 P
A61       @0 A
A64 01  1    @0 Journal of magnetism and magnetic materials
A66 01      @0 NLD
C01 01    ENG  @0 Using a semi-classical approach, Hood, Falicov and Penn have studied the effects of interfacial roughness on the magnetoresistance (MR) of iron based trilayers (Fe/Cr/Fe and Fe/Cu/Fe). We extend their theory to magnetic metallic multilayers composed of N bilayers ferromagnetic-normal metal. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The averaged effects due to impurities, interdiffusion, band structure, etc. are included in a simple way using two phenomenological parameters S↑ and S↓ for two directions of spin. MR variation with S↑, S↓ and relaxation time is reported. We analyse also recent experimental data giving the influence of number of bilayers on the MR of Co/Cu multilayers for different temperatures.
C02 01  3    @0 001B70C50J
C03 01  3  FRE  @0 Rugosité @5 02
C03 01  3  ENG  @0 Roughness @5 02
C03 02  3  FRE  @0 Magnétorésistance @5 03
C03 02  3  ENG  @0 Magnetoresistance @5 03
C03 03  X  FRE  @0 Théorie semiclassique @5 04
C03 03  X  ENG  @0 Semiclassical theory @5 04
C03 03  X  SPA  @0 Teoría semiclásica @5 04
C03 04  3  FRE  @0 Structure interface @5 05
C03 04  3  ENG  @0 Interface structure @5 05
C03 05  X  FRE  @0 Modèle phénoménologique @5 09
C03 05  X  ENG  @0 Phenomenological model @5 09
C03 05  X  SPA  @0 Modelo fenomenológico @5 09
C03 06  3  FRE  @0 Cuivre @2 NC @5 15
C03 06  3  ENG  @0 Copper @2 NC @5 15
C03 07  3  FRE  @0 Multicouche @5 16
C03 07  3  ENG  @0 Multilayers @5 16
C03 08  3  FRE  @0 Cobalt @2 NC @5 17
C03 08  3  ENG  @0 Cobalt @2 NC @5 17
C03 09  3  FRE  @0 Bicouche @5 19
C03 09  3  ENG  @0 Bilayers @5 19
C03 10  3  FRE  @0 Matériau ferromagnétique @5 20
C03 10  3  ENG  @0 Ferromagnetic materials @5 20
N21       @1 109

Format Inist (serveur)

NO : PASCAL 10-0168545 INIST
ET : Effects of interfacial roughness on the magnetoresistance of Co/Cu multilayers
AU : TRIGUI (F.); ELSAFI (B.); FAKHFAKH (Z.); BEAUVILLAIN (P.)
AF : Lamacop, Department of physics, Faculté des Sciences de Sfax, University of sfax, route Soukra km3.5, B.P 1071/3000 Sfax/Tunisie (1 aut., 2 aut., 3 aut.); Institut d'Electronique Fondamentale, Bât 220 Université Paris sud/91405 Orsay/France (4 aut.)
DT : Publication en série; Niveau analytique
SO : Journal of magnetism and magnetic materials; ISSN 0304-8853; Coden JMMMDC; Pays-Bas; Da. 2010; Vol. 322; No. 6; Pp. 596-602; Bibl. 19 ref.
LA : Anglais
EA : Using a semi-classical approach, Hood, Falicov and Penn have studied the effects of interfacial roughness on the magnetoresistance (MR) of iron based trilayers (Fe/Cr/Fe and Fe/Cu/Fe). We extend their theory to magnetic metallic multilayers composed of N bilayers ferromagnetic-normal metal. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The averaged effects due to impurities, interdiffusion, band structure, etc. are included in a simple way using two phenomenological parameters S↑ and S↓ for two directions of spin. MR variation with S↑, S↓ and relaxation time is reported. We analyse also recent experimental data giving the influence of number of bilayers on the MR of Co/Cu multilayers for different temperatures.
CC : 001B70C50J
FD : Rugosité; Magnétorésistance; Théorie semiclassique; Structure interface; Modèle phénoménologique; Cuivre; Multicouche; Cobalt; Bicouche; Matériau ferromagnétique
ED : Roughness; Magnetoresistance; Semiclassical theory; Interface structure; Phenomenological model; Copper; Multilayers; Cobalt; Bilayers; Ferromagnetic materials
SD : Teoría semiclásica; Modelo fenomenológico
LO : INIST-17230.354000181677350050
ID : 10-0168545

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Pascal:10-0168545

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