- Author's uniq id: Xu S
- Total number of names:
- Total number of records with affiliations: 15
| S Xu |
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| S. H. Xu |
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| S. Xu |
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| S.-K. Xu |
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| S.K. Xu |
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| Sai Xu |
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| Shiqing Xu |
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| Shukun Xu |
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<g><k>Xu S</k><l><g><k>S Xu</k><l><g><k><affiliation>NONE (BIBLIO)</affiliation></k><l><i>000105</i></l><n>1</n><t>1</t></g></l><n>1</n><t>1</t></g><g><k>S. H. Xu</k><l><g><k><affiliation>NONE (BIBLIO)</affiliation></k><l><i>000007</i></l><n>1</n><t>1</t></g></l><n>1</n><t>1</t></g><g><k>S. Xu</k><l><g><k><affiliation><inist:fA14 i1="01"><s1>Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, The People's Republic of China</s1><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14></affiliation></k><l><i>002D42</i></l><n>1</n><t>1</t></g><g><k><affiliation>NONE (BIBLIO)</affiliation></k><l><i>000045</i><i>000205</i><i>000C62</i></l><n>3</n><t>3</t></g></l><n>2</n><t>4</t></g><g><k>S.-K. Xu</k><l><g><k><affiliation>NONE (BIBLIO)</affiliation></k><l><i>000740</i></l><n>1</n><t>1</t></g></l><n>1</n><t>1</t></g><g><k>S.K. Xu</k><l><g><k><affiliation>NONE (BIBLIO)</affiliation></k><l><i>000740</i></l><n>1</n><t>1</t></g></l><n>1</n><t>1</t></g><g><k>Sai Xu</k><l><g><k><affiliation wicri:level="4"><nlm:affiliation>State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, 2699 Qianjin Street, Changchun, 130012, People's Republic of China. songhw@jlu.edu.cn.</nlm:affiliation><country xml:lang="fr">République populaire de Chine</country><wicri:regionArea>State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, 2699 Qianjin Street, Changchun, 130012</wicri:regionArea><orgName type="university">Université de Jilin</orgName><placeName><settlement type="city">Changchun</settlement><region type="province">Jilin</region></placeName></affiliation></k><l><i>000279</i></l><n>1</n><t>1</t></g><g><k><affiliation>NONE</affiliation></k><l><i>000453</i></l><n>1</n><t>1</t></g></l><n>2</n><t>2</t></g><g><k>Shiqing Xu</k><l><g><k><affiliation><nlm:affiliation>Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, PO Box 800-211, 201800. shiqingxu75@hotmail.com</nlm:affiliation><wicri:noCountry code="subField">201800</wicri:noCountry></affiliation></k><l><i>001B02</i></l><n>1</n><t>1</t></g><g><k><affiliation>NONE</affiliation></k><l><i>000446</i><i>001511</i></l><n>2</n><t>2</t></g><g><k><wicri:noCountry code="subField">201800</wicri:noCountry></k><l><i>001B02</i></l><n>1</n><t>1</t></g></l><n>3</n><t>4</t></g><g><k>Shukun Xu</k><l><g><k><affiliation wicri:level="1"><nlm:aff id="A1">Department of Chemistry, Northeastern University, Shenyang, 110004, P. R. China</nlm:aff><country xml:lang="fr">République populaire de Chine</country><wicri:regionArea>Department of Chemistry, Northeastern University, Shenyang, 110004</wicri:regionArea><wicri:noRegion>110004</wicri:noRegion></affiliation></k><l><i>000F48</i></l><n>1</n><t>1</t></g></l><n>1</n><t>1</t></g></l><n>8</n><t>15</t></g>
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