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Analysis
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Serveur d'exploration sur le thulium - Analysis (France)

Index « Titre (en) » - entrée « electron »
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List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
000364 (1997-07-15) M. Pompa [France] ; A. M. Flank ; P. Lagarde ; J. C. Rife ; I. Stekhin [Russie] ; M. Nakazawa [Japon] ; H. Ogasawara ; A. KotaniExperimental and theoretical comparison between absorption, total electron yield, and fluorescence spectra of rare-earth M5 edges
000387 (1997) M. Pompa [France] ; A. M. Flank [France] ; P. Lagarde [France] ; J. Rife [États-Unis] ; I. Stekhin [Russie] ; M. Nakazawa [Japon] ; H. Ogasawara [Russie] ; A. Kotani [Japon]Experimental and theoretical comparison between absorption, total electron yield and fluorescence spectra of the thulium M5 edge
000390 (1996-10-14) H. P. Moll [France] ; J. Van Tol [France] ; P. Wyder [France] ; M. S. Tagirov [Russie] ; D. A. Tayurskii [Russie]High-Frequency Electron Paramagnetic Resonance of Tm3+ Ions in Lanthanum and Thulium Ethylsulphate Single Crystals
000429 (1995) Colette Chassard-Bouchaud [France] ; Michelle Hubert [France] ; Françoise Escaig [France] ; René Louis Inglebert [France]Cellular and subcellular localization of chromium in the crab Liocarcinus puber (Brachyrhyncha) by transmission electron microscopy, secondary ion mass spectrometry and electron microprobe analysis
000511 (1992) Colette Chassard-Bouchaud [France] ; Françoise Escaig [France] ; Pierre Boumati [France] ; Pierre Galle [France]Microanalysis and image processing of stable and radioactive elements in ecotoxicology. Current developments using SIMS microscope and electron microprobe
000524 (1991) V. Hardy [France] ; M. Hervieu ; D. Groult ; J. ProvostHigh resolution electron microscopy study of electronic energy loss effects in thallium-based superconducting copper oxides irradiated by 5.8 GeV-Xeions

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