Serveur d'exploration sur le thulium

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Le cluster characterization - fabrication

Terms

18characterization
4fabrication
10band
4modelling
4amplification
7films
6thin
2devices

Associations

Freq.WeightAssociation
44characterization - fabrication
33band - modelling
33band - characterization
33amplification - characterization
33amplification - band
22fabrication - films
55films - thin
22devices - modelling
22characterization - films
22band - devices

Documents par ordre de pertinence
000033 (2012-09-14) Sébastien Forissier [France]Fabrication and characterization of down-conversion materials in thin films for photovoltaic applications
000190 (2005-11-24) Basile Faure [France]Fabrication and characterization of silica based thulium doped optical fibres: Influence of the rare earth's environment on the S-band amplification
000074 (2010-11-10) Pavel Peterka [République tchèque] ; Ivan Kasik [République tchèque] ; Anirban Dhar [République tchèque] ; Bernard Dussardier [France] ; Wilfried Blanc [France]Thulium-doped silica fibers with enhanced 3H4 level lifetime: modelling the devices for 800-820 nm band
000102 (2010) Pavel Peterka [République tchèque] ; Ivan Kašík [République tchèque] ; Anirban Dhar [République tchèque] ; Bernard Dussardier [France] ; Wilfried Blanc [France]Thulium-doped silica fibers with enhanced 3H4 level lifetime : modelling the devices for 800-820 nm band
000188 (2006) Wilfried Blanc [France] ; Pavel Peterka [République tchèque] ; Basile Faure [France] ; Bernard Dussardier [France] ; Gérard Monnom [France] ; Ivan Kasik [République tchèque] ; Jiri Kanka [République tchèque] ; David Simpson [Australie] ; Greg Baxter [Australie]Characterization of a thulium-doped silica-based optical fibre for S-band amplification
000189 (2006) Wilfried Blanc [France] ; Basile Faure [France] ; Bernard Dussardier [France] ; Gérard Monnom [France] ; Pavel Peterka [République tchèque] ; Ivan Kašík [République tchèque] ; Jiri Kanka [République tchèque] ; David Simpson [Australie] ; Gregory Baxter [Australie]Characterization of a thulium-doped silica-based optical fibre for S-band amplification
000210 (2005) V. Nazabal [France] ; C. Bousquet [France] ; Petr Nemec [République tchèque] ; Jaroslav Jedelsky [République tchèque] ; Miloslav Frumar [République tchèque] ; J.-L. Adam [France] ; C. Duverger [France] ; A. M. Jurdyc [France] ; B. Jacquier [France] ; P. Vinatier [France] ; T. Cardinal [France]Fabrication and characterization of chalcogenide films
000049 (2012) Sébastien Forissier [France] ; Hervé Roussel [France] ; Patrick Chaudouet [France] ; Antonio Pereira [France] ; Jean-Luc Deschanvres [France] ; Bernard Moine [France]Thulium and Ytterbium-Doped Titanium Oxide Thin Films Deposited by Ultrasonic Spray Pyrolysis
000078 (2010) Virginie Nazabal [France] ; Anne-Marie Jurdyc [France] ; P. Nemec [République tchèque] ; Marie-Laure Brandily-Anne [France] ; Laëtitia Petit [États-Unis] ; Katheleen Richardson [États-Unis] ; Philippe Vinatier [France] ; Cathel Bousquet [France] ; Thierry Cardinal [France] ; Stanislav Pechev [France] ; Jean-Luc Adam [France]Amorphous Tm3+ doped sulfide thin films fabricated by sputtering
000219 (2004) A. Beaurain [France] ; S. Dupont [France] ; H. W. Li [France] ; J. P. Vilcot [France] ; C. Legrand [France] ; J. Harari [France] ; M. Constant [France] ; D. Decoster [France]Characterization and fabrication of InGaAsP/InP deep‐etched micro‐waveguides
000222 (2004) P. Peterka [France, République tchèque] ; B. Faure [France] ; W. Blanc [France] ; M. Karasek [République tchèque] ; B. Dussardier [France]Theoretical modelling of S-band thulium-doped silica fibre amplifiers
000258 (2001-04) J. I. Arnaudas [Espagne] ; M. Ciria [Espagne] ; C. De La Fuente [Espagne] ; L. Benito [Espagne] ; A. Del Moral [Espagne] ; R. C. C. Ward [Royaume-Uni] ; M. R. Wells [Royaume-Uni] ; C. Dufour [France] ; K. Dumesnil [France] ; A. Mougin [France]Magnetoelastic stresses in rare-earth thin films and superlattices
000499 (1993) Y. Charreire [France] ; D.-R. Svoronos [France] ; I. Ascone [France] ; O. Tolonen ; L. Niinistö ; M. LeskelExtended X-ray absorption fine structure studies of luminescent centers in II-VI thin films
000013 (2014) Tawfique Hasan [Royaume-Uni] ; Zhipei Sun [Finlande] ; Pingheng Tan [République populaire de Chine] ; Daniel Popa [Royaume-Uni] ; Emmanuel Flahaut [France] ; Edmund J. R. Kelleher [Royaume-Uni] ; Francesco Bonaccorso [Italie] ; Fengqiu Wang [République populaire de Chine] ; Zhe Jiang [Royaume-Uni] ; Felice Torrisi [Royaume-Uni] ; Giulia Privitera [Royaume-Uni] ; Valeria Nicolosi [Irlande (pays)] ; Andrea C. Ferrari [Royaume-Uni]Double-Wall Carbon Nanotubes for Wide-Band, Ultrafast Pulse Generation
000028 (2012-12-20) Bochra Chahid [France]Development and characterization of new contrast agents for lipid ultrasensitive magnetic resonance imaging for molecular imaging
000054 (2011-08-24) Pavel Honzatko [République tchèque] ; Anirban Dhar [République tchèque] ; Ivan Kasik [République tchèque] ; Ondrej Podrazky [République tchèque] ; Vlastimil Matejec [République tchèque] ; Pavel Peterka [République tchèque] ; Wilfried Blanc [France] ; Bernard Dussardier [France]Preparation and characterization of highly thulium- and alumina-doped optical fibers for single-frequency fiber lasers
000069 (2011) P. Honzatko [République tchèque] ; A. Dhar [République tchèque] ; I. Kaslk [République tchèque] ; O. Podrazky [République tchèque] ; V. Matejec [République tchèque] ; P. Peterka [République tchèque] ; W. Blanc [France] ; B. Dussardier [France]Preparation and characterization of highly thulium- and alumina-doped optical fibers for single-frequency fiber lasers
000085 (2010) H. Gebavi [Italie] ; D. Milanese [Italie] ; R. Balda [Espagne] ; S. Chaussedent [France] ; M. Ferrari [Italie] ; J. Fernandez [Espagne] ; M. Ferraris [Italie]Spectroscopy and optical characterization of thulium doped TZN glasses
000089 (2010) Barbara Gregorius [Allemagne] ; Dirk Schaumlöffel [France] ; Andreas Hildebrandt [Allemagne] ; Andreas Tholey [Allemagne]Characterization of metal‐labelled peptides by matrix‐assisted laser desorption/ionization mass spectrometry and tandem mass spectrometry
000104 (2009-06-28) Laurent Labonté [France] ; Nicolas Ducros [France] ; Philippe Roy [France] ; Georges Humbert [France] ; Sébastien Février [France] ; Vipin K. Rastogi [États-Unis] ; M. Pal [Inde] ; S. K. Bhadra [Inde]Design, computation and characterization of thulium-doped photonic crystal fibre for emission around 1700 nm
000112 (2009) Jerome Roger [France] ; Fabienne Audubert [France] ; Yann Le Petitcorps [France]Thermal reaction of SiC films with Mo, Re and Mo-Re alloy
000113 (2009) M. Elmassalami [Brésil] ; R. E. Rapp [Brésil] ; F. A. B. Chaves [Brésil] ; R. Moreno [Brésil] ; H. Takeya [Japon] ; B. Ouladdiaf [France] ; J. W. Lynn [États-Unis] ; Q. Huang [États-Unis] ; R. S. Freitas [Brésil] ; N. F. Jr Oliveria [Brésil]Synthesis and magnetic characterization of TmCo2B2C
000128 (2008) A. Gocalinska [Pologne] ; P. J. Deren [Pologne] ; P. Gluchowski [Pologne] ; Ph. Goldner [France] ; O. Guillot-Noël [France]Spectroscopic characterization of LaAlO3 crystal doped with Tm3+ ions
000159 (2007) J. H. Mun [Japon, France] ; Amor Jouini [Japon] ; A. Novoselov [Japon] ; Y. Guyot [France] ; A. Yoshikawa [Japon] ; H. Ohta [Japon] ; H. Shibata [Japon] ; Y. Waseda [Japon] ; G. Boulon [Japon, France] ; T. Fukuda [Japon]Growth and characterization of Tm-doped Y2O3 single crystals
000181 (2006) M. Schellhorn [France]Performance of a Ho:YAG thin-disc laser pumped by a diode-pumped 1.9 μm thulium laser
000194 (2005) Michel Drache [France] ; Pascal Roussel [France] ; Pierre Conflant [France] ; Jean-Pierre Wignacourt [France]Bi17Yb7O36 and BiYbO3 crystal structures. Characterization of thulium and lutetium homologous compounds
000211 (2005) Stéphan Guy [France] ; A. M. Jurdyc [France] ; Bernard Jacquier [France] ; W. M. Meffre [France]Excited states Tm spectroscopy in ZBLAN glass for S-band amplifier
000232 (2003) R. Saez-Puche [Espagne] ; E. Jimenez [Espagne] ; J. Isasi [Espagne] ; M. T. Fernandez-Diaz [France] ; J. L. Garcia-Munoz [Espagne]Structural and magnetic characterization of RCrO4 oxides (R = Nd, Er and Tm)
000238 (2002-10-01) M. C. Pujol [Espagne] ; F. Guell [Espagne] ; X. Mateos [Espagne] ; Jna. Gavalda [Espagne] ; R. Sole [Espagne] ; J. Massons [Espagne] ; M. Aguilo [Espagne] ; F. Diaz [Espagne] ; G. Boulon [France] ; A. Brenier [France]Crystal growth and spectroscopic characterization of Tm3+-doped KYb(WO4)2 single crystals
000275 (2001) F. Roy [France] ; D. Bayart ; A. L. Sauze ; P. BanielNoise and gain band management of thulium-doped fiber amplifier with dual-wavelength pumping schemes
000310 (2000) D. Bayart [France] ; P. Baniel ; A. Bergonzo ; J. Y. Boniort ; P. Bousselet ; L. Gasca ; D. Hamoir ; F. Leplingard ; A. Le Sauze ; P. Nouchi ; F. Roy ; P. SillardBroadband optical fibre amplification over 17.7 THz range
000354 (1998) G. L. Bourdet [France] ; G. Lescroart [France]Theoretical modelling of mode formation in Tm3+ :YVO4 microchip lasers
000478 (1994) S. Boj [France] ; E. Delevaque [France] ; J. Y. Allain [France] ; J. F. Bayon [France] ; P. Niay [France] ; P. Bernage [France]High efficiency diode pumped thulium-doped silica fibre lasers with intracore Bragg gratings in the 1.9-2.1 μm band

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