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Serveur d'exploration sur le nickel au Maghreb - Checkpoint (Istex)

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List of bibliographic references

Number of relevant bibliographic references: 12.
Ident.Authors (with country if any)Title
000016 (2013) Martin Mowitz [Suède] ; Erik Zimerson [Suède] ; Cecilia Svedman [Suède] ; Magnus Bruze [Suède]Patch testing with serial dilutions and thin‐layer chromatograms of oak moss absolutes containing high and low levels of atranol and chloroatranol
000062 (2012) R. Masrour [Maroc] ; M. Hamedoun [Maroc] ; A. Benyoussef [Maroc]Mean-field and high temperature series expansion calculations of some magnetic properties of Ising and XY antiferromagnetic thin-films
000067 (2012) Sana Ben Amor [Tunisie] ; Wissem Dimassi [Tunisie] ; Mohamed Ali Tebai [Tunisie] ; Hatem Ezzaouia [Tunisie]Effect of the hydrogen flow rate on the structural and optical properties of hydrogenated amorphous silicon thin films prepared by plasma enhanced chemical vapor deposition
000097 (2011) A. Souissi [Tunisie] ; A. Marzouki [Tunisie, France] ; A. Sayari [Tunisie] ; V. Sallet [France] ; A. Lusson [France] ; M. Oueslati [Tunisie]Origin of the Raman mode at 379 cm−1 observed in ZnO thin films grown on sapphire
000162 (2009) Chrif Dridi [Tunisie, France] ; Maha Benzarti-Ghdira [Tunisie] ; Francis Vocanson [France] ; Rafik Ben Chaabane [Tunisie] ; Joel Davenas [France] ; Hafedh Ben Ouada [Tunisie]Optical and electrical properties of semi-conducting calix[5,9]arene thin films with potential applications in organic electronics
000207 (2008) Nejib Ihzaz [Tunisie] ; Mohamed Oumezzine [Tunisie] ; Jens Kreisel [France] ; Henri Vincent [France] ; Stephane Pignard [France]Growth of SmNiO3 Thin Films on LaAlO3 Single Crystals
000362 (2004) N. Ihzaz [France, Tunisie] ; S. Pignard [France] ; J. Kreisel [France] ; H. Vincent [France] ; J. Marcus [France] ; J. Dhahri [Tunisie] ; M. Oumezzine [Tunisie]Synthesis and characterization of SmNiO3 thin films
000588 (2000) R. S. Mane [Inde] ; C. D. Lokhande [Inde]Chemical deposition method for metal chalcogenide thin films
000704 (1998) N. Guettari [Algérie] ; J. Ouerfelli [France] ; J. C. Bernède [France] ; A. Khelil [Algérie] ; J. Pouzet [France] ; A. Conan [France]Photoconductive WSe2 thin films obtained by solid state reaction in the presence of a thin nickel layer
000760 (1997) R. Ben Chaabane [France] ; G. Guillaud [France] ; M. Gamoudi [France]Study of the electrical properties of thin film transistors based on nickel phthalocyanine
000884 (1995) A. Mzerd [Maroc] ; D. Sayah [Maroc] ; G. Brun [France] ; J. C. Tedenac [France] ; A. Boyer [France]Crystal growth and sticking coefficient of Bi2Te3 thin films on Si(1 1 1) substrate
001137 (1962) International Conference on the Electrical and Magnetic Properties of Thin Metallic Layers, Louvain, September 1961

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