Serveur d'exploration sur le nickel au Maghreb

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Le cluster Thin films - Electrical conductivity

Terms

18Thin films
9Electrical conductivity
6Solid state reaction
5Photoconductivity
4Binary compounds
7Annealing
3Photoelectron spectroscopy
3Molybdenum sulfides

Associations

Freq.WeightAssociation
66Electrical conductivity - Thin films
44Solid state reaction - Thin films
44Photoconductivity - Thin films
44Binary compounds - Thin films
44Annealing - Electrical conductivity
33Photoelectron spectroscopy - Thin films
33Photoconductivity - Solid state reaction
33Molybdenum sulfides - Thin films
33Binary compounds - Molybdenum sulfides
33Annealing - Thin films
22Photoelectron spectroscopy - Solid state reaction
22Molybdenum sulfides - Solid state reaction
22Molybdenum sulfides - Photoconductivity

Documents par ordre de pertinence
000255 (1999) J. C. Bernède [France] ; J. Pouzet [France] ; E. Gourmelon [France] ; H. Hadouda [Algérie]Recent studies on photoconductive thin films of binary compounds
000268 (1998) N. Guettari [Algérie] ; J. Ouerfelli [France] ; J. C. Bernede [France] ; A. Khelil [Algérie] ; J. Pouzet [France] ; A. Conan [France]Photoconductive WSe2 thin films obtained by solid state reaction in the presence of a thin nickel layer
000275 (1997) E. Gourmelon [France] ; H. Hadouda [Algérie] ; Jc Bernede [France] ; J. Pouzet [France]High quality crystalline MoS2 thin films obtained on Ni coated substrates: optimization of the post-annealing treatment
000285 (1997) H. Hadouda [Algérie] ; J. C. Bernede [France] ; E. Gourmelon [France] ; J. Pouzet [France]Experimental obviousness of the necessity for a thin Ni interfacial layer to obtain highly ordered photoconductive MoS2 films
000265 (1998) J. Ouerfelli [France] ; Z. Jlaïel [France] ; N. Guettari [Algérie] ; E. Gourmelon [France] ; J. Pouzet [France] ; J. C. Bernede [France] ; A. Khelil [Algérie] ; M. Zoater [Liban] ; A. Conan [France]De la nécessité d'une fine couche de nickel pour obtenir des couches minces de MoSe2 photoconductrices
000139 (2008) L. Cattin [France] ; B. A. Reguig [Algérie] ; A. Khelil [Algérie] ; M. Morsli [France] ; K. Benchouk [Algérie] ; J. C. Bernede [France]Properties of NiO thin films deposited by chemical spray pyrolysis using different precursor solutions
000264 (1998) N. Guettari [Algérie] ; J. Ouerfelli [France] ; J. C. Bernède [France] ; A. Khelil [Algérie] ; J. Pouzet [France] ; A. Conan [France]Photoconductive WSe2 thin films obtained by solid state reaction in the presence of a thin nickel layer
000145 (2008) M. Hemmous [Algérie] ; A. Layadi [Algérie] ; A. Guittoum [Algérie] ; A. Bourzami [Algérie] ; A. Benabbas [Algérie]Effect of deposition rate and thickness on the structural and electrical properties of evaporated Ni/glass and Ni/Si(100) thin films
000177 (2006) S. Chouf [Algérie] ; M. Morin [France] ; S. Belkahla [Algérie] ; G. Guenin [France]Equivalent thermo-mechanical treatments in an equiatomic Ti-Ni shape memory alloy
000269 (1998) B. Ghebouli [Algérie] ; A. Layadi [Algérie] ; L. Kerkache [Algérie]Effect of the substrate on the structural and electrical properties of dc sputtered Ni thin films
000013 (2014) M. Hemmous [Algérie] ; A. Layadi [Algérie] ; A. Guittoum [Algérie] ; N. Souami [Algérie] ; M. Mebarki [Algérie] ; N. Menni [Algérie]Structure, surface morphology and electrical properties of evaporated Ni thin films: Effect of substrates, thickness and Cu underlayer
000020 (2014) M. Jlassi [Tunisie] ; I. Sta [Tunisie] ; M. Hajji [Tunisie] ; B. Ben Haoua [Algérie] ; H. Ezzaouia [Tunisie]Effect of annealing atmosphere on the electrical properties of nickel oxide/zinc oxide p-n junction grown by sol-gel technique
000021 (2014) A. Derafa [Algérie] ; G. Tellouche [Algérie] ; K. Hoummada [France] ; A. Bouabellou [Algérie] ; D. Mangelinck [France]Effect of alloying elements Mo and W on Ni silicides formation
000040 (2013) M. Arab Pour Yazdi [France] ; N. Fenineche [France] ; E. Aubry [France] ; A. Kaibi [Algérie] ; A. Billard [France]Microstructure and magnetic properties of Ni3Fe solid solution thin films deposited by DC-magnetron sputtering
000046 (2013) Khalid Hoummada [France] ; Gamra Tellouche [Algérie] ; Ivan Blum [France] ; Alain Portavoce [France] ; Marion Descoins [France] ; Dominique Mangelinck [France]Direct observation of Ni decorated dislocation loops within As+-implanted silicon and arsenic clustering in Ni silicide contact
000073 (2011) M. Boukelkoul [Algérie] ; A. Haroun [Algérie]Structural, magnetic and magneto-optical properties of ultrathin films of nickel on iridium (001)
000107 (2009) S. Abdi [Algérie] ; S. Lebaili [Algérie] ; B. Malki [France]Tribological and adhesion behaviour of hard alloy powder NiCrBCSi(Fe) coatings thermally sprayed on 60CrMn4 steel
000108 (2009) M. Ferkhi [France, Algérie] ; S. Khelili [Algérie] ; L. Zerroual [Algérie] ; A. Ringuede [France] ; M. Cassir [France]Synthesis, structural analysis and electrochemical performance of low-copper content La2Ni1-XCuX04+δ materials as new cathodes for solid oxide fuel cells
000158 (2007) S.-M. Cherif [France] ; A. Layadi [Algérie] ; J. Ben Youssef [France] ; C. Nacereddine [Algérie] ; Y. Roussigne [France]Study of the magnetic anisotropy in Ni/Cu and Ni/glass thin films
000159 (2007) B. A. Reguig [Algérie] ; A. Khelil [Algérie] ; L. Cattin [France] ; M. Morsli [France] ; J. C. Bernede [France]Properties of NiO thin films deposited by intermittent spray pyrolysis process
000224 (2003) A. Kellou [Algérie] ; N. E. Fenineche [France] ; A. Tadjer [Algérie] ; H. Aourag [Algérie, France]Ferromagnetic and antiferromagnetic couplings in Cr(0 0 1) thin films and TM monolayer/Cr(0 0 1) (TM = Ti, V, Cr, Mn, Fe, Co, Ni)
000240 (2001) K. Lahem [Algérie] ; R. Cherfi [Algérie] ; M. Aoucher [Algérie]Hydrogen interaction on metal/hydrogenated amorphous silicon Schottky structures: adsorption/desorption effects
000243 (2001) Ahmed Boutarfaia [Algérie]Study of the solid state reaction and the morphotropic phase boundary in Pb(Zr, Ti)O3-Pb(Fe1/5, Ni1/5, Sb3/5)O3 ceramics
000244 (2001) R. Louahdi [Algérie] ; G. Saindrenan [France] ; R. Le Gall [France] ; G. Liao [France] ; P. Paillard [France]Influence of recovery on dynamic segregation of sulphur to surface of cold rolled nickel
000254 (1999) M. Da Cunha Belo [Portugal] ; N. E Hakiki [Algérie] ; M. G. S Ferreira [Portugal]Semiconducting properties of passive films formed on nickel–base alloys type Alloy 600: influence of the alloying elements
000277 (1997) R. Louahdi [Algérie] ; E. H. Ouakdi [Algérie] ; G. Saindrenan [France] ; R. Legall [France] ; A. Boucenna [Algérie]The effect of non-equilibrium grain boundary segregation on the tensile properties and the electrochemical behaviour of nickel
000281 (1997) C. Boudaren [Algérie] ; A. Mousser [Algérie] ; L. Chuc [Algérie]PZT formation in the presence of dopants

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