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Serveur d'exploration sur l'Indium - Analysis (Russie)

Index « Keywords » - entrée « Secondary ion mass spectrometry »
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Secondary ion mass spectra < Secondary ion mass spectrometry < Seebeck effect  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 9.
Ident.Authors (with country if any)Title
000201 (2008) MOVPE growth and characterization of InAlGaN films and InGaN/InAlGaN MQW structures
000204 (2008) Influence of the GaAs substrate orientation on the composition of GaxIn1-xP (x ≃ 0.5) grown by LPE and MOCVD
000212 (2008) Effect of InGaN underneath layer on MOVPE-grown InGaN/GaN blue LEDs
000300 (2006) Photovoltaic properties and technological aspects of In1-xGaxN/Si, Ge (0
000335 (2005) Thermodynamic calculation and experimental investigation of the surface enrichment of electrochemically activated Al-Me (Sn, In, Zn) alloys
001626 (1992) Redistribution of magnesium in InAs during postimplantation annealing
001638 (1992) Phase interaction and heteroepitaxy in the InPAsSb system
001743 (1991) Some effects influencing the distribution profiles of implanted ions in crystalline semiconductor III-V targets after ion implantation
001952 (1989) The charge state of hydrogen and hydrogen diffusion in InP and InGaAs

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