Serveur d'exploration sur l'Indium - Analysis (Russie)

Index « Auteurs » - entrée « V. V. Ratnikov »
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V. V. Proklov < V. V. Ratnikov < V. V. Roddatis  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
000207 (2008) Growth striations and dislocations in highly doped semiconductor single crystals
000899 (2001-05) X-ray Diffractometric Study of the Influence of a Buffer Layer on the Microstructure of Molecular-Beam Epitaxial InN Layers of Different Thicknesses
000963 (2001) Optical control of group-III and N flux intensities in plasma-assisted MBE with RF capacitively-coupled magnetron nitrogen activator
000B84 (2000) Hexagonal InN/sapphire heterostructures: interplay of interface and layer properties
000D63 (1999) Plasma-assisted MBE growth of GaN and InGaN on different substrates
000E59 (1998-07) In and Si distribution in synthetic opals
001742 (1991) Specific features of crystallization of In-doped germanium under microgravity

List of associated KwdEn.i

Nombre de
documents
Descripteur
5Experimental study
4Molecular beam epitaxy
3III-V semiconductors
3Indium nitrides
3XRD
2Crystal growth
2Crystal growth from vapors
2Gallium nitrides
2SIMS
2Segregation
2Silicon
1Aluminium oxides
1Annealing
1Binary compounds
1Bridgman method
1Characterization
1Composite materials
1Crystal growth from melts
1Crystalline structure
1Crystallization
1Czochralski method
1Deformation
1Directional solidification
1Dislocations
1Emission spectroscopy
1Epitaxial layers
1Fluctuations
1Gallium
1Gallium antimonides
1Germanium Indium Alloys
1Growth striation
1Heat transfer
1Heterostructures
1III-V compound
1Impurity distribution
1In situ
1Indium
1Indium additions
1Indium arsenides
1Indium compounds
1Interfacial layer
1Layered crystals
1Magnetrons
1Mass transfer
1Microstructure
1Misfit dislocations
1Mismatch lattice
1Mixing ratio
1Monocrystals
1Nitrogen compounds
1Operating mode
1Optical absorption
1Optical method
1Photoluminescence
1Plasma sources
1Porosity
1Precursor
1Process control
1Semiconductor doping
1Silicon additions
1Solid solutions
1Solid-solid interfaces
1Stress effects
1TEM
1Ternary compounds
1Thin films
1Voids
1X ray diffractometry
1X-ray absorption spectra
1X-ray topography

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