Auteurs
Analysis
Russie
Racine
Analysis
Russie
Repository
Accueil
Racine
Racine

Serveur d'exploration sur l'Indium - Analysis (Russie)

Index « Auteurs » - entrée « O. I. Khrykin »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
O. I. Govorkov < O. I. Khrykin < O. I. Kondratov  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 10.
Ident.Authors (with country if any)Title
000442 (2004) Transverse negative magnetoresistance of two-dimensional structures in the presence of a strong in-plane magnetic field: Weak localization as a probe of interface roughness
000548 (2003-05-15) Electron-electron interaction with decreasing conductance
000571 (2003-02) Segregation of Indium in InGaAs/GaAs Quantum Wells Grown by Vapor-Phase Epitaxy
000651 (2003) InGaAsN/GaAs QD and QW structures grown by MOVPE
000876 (2001-10) A New Method for Determining the Sharpness of InGaAs/GaAs Heterojunctions by Auger Depth Profiling
000922 (2001-02) Subnanometer Resolution in Depth Profiling Using Glancing Auger Electrons
000928 (2001) X-ray optical scheme for diffraction study of semiconductor quantum wells and quantum dots
000A24 (2000-12-15) Low-field negative magnetoresistance in double-layer structures
000A95 (2000-04) Single-Crystalline GaAs, AlGaAs, and InGaAs Layers Grown by Metalorganic VPE on Porous GaAs Substrates
000F09 (1998-01) Characterization of GaAs/ InxGa1-xAs quantum-dot heterostructures by electrical and optical methods

List of associated KwdEn.i

Nombre de
documents		Descripteur
9Gallium arsenides
7Experimental study
7Indium compounds
5III-V semiconductors
3Quantum wells
3Semiconductor quantum wells
3VPE
2Auger electron spectra
2Crystal growth from vapors
2Indium arsenides
2Photoluminescence
2Quantum interference phenomena
2Semiconductor quantum dots
1AES
1Aluminium compounds
1Atomic force microscopy
1Binary compounds
1Carrier lifetime
1Chemical beam epitaxy
1Chemical structure
1Composition effect
1Electrical conductivity
1Exchange interactions (electron)
1Excitons
1Experiments
1Gallium nitrides
1Growth mechanism
1High angular resolution
1Indium nitrides
1Interface states
1Interfaces
1Low pressure
1MOVPE method
1Magnetic field effects
1Magnetoresistance
1Measuring methods
1Multiple quantum well
1Negative magnetoresistance
1Property structure relationship
1Pseudomorphic growth
1Quantum dots
1Roughness
1Segregation
1Semiconducting gallium arsenide
1Semiconducting indium gallium arsenide
1Semiconductor heterojunctions
1Semiconductor junctions
1Semiconductor thin films
1Sensitivity
1Spatial distribution
1Sputter deposition
1Surface charging
1Surface segregation
1Ternary compounds
1Theoretical study
1Thin films
1Uniformity
1Weak localisation
1X ray diffraction analysis
1X ray optics
1porous semiconductors
1weak localisation

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/Russie/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/Russie/Analysis/Author.i -k "O. I. Khrykin" 

HfdIndexSelect -h $EXPLOR_AREA/Data/Russie/Analysis/Author.i  \
                -Sk "O. I. Khrykin" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/Russie/Analysis/biblio.hfd

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    Russie
   |étape=   Analysis
   |type=    indexItem
   |index=    Author.i
   |clé=    O. I. Khrykin
}}
Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024