Serveur d'exploration sur l'Indium - Analysis (Russie)

Index « Auteurs » - entrée « N. K. Polyakov »
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N. K. Poletaev < N. K. Polyakov < N. K. Strizhov  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 28.
[0-20] [0 - 20][0 - 28][20-27][20-40]
Ident.Authors (with country if any)Title
000349 (2005) Properties of InGaAsN heterostructures emitting at 1.3-1.55 μm
000399 (2004-06) Spectroscopy of Exciton States of InAs Quantum Molecules
000411 (2004-04) The Effect of Exposure to Arsenic Flow on the Optical Properties of Quantum Dot Arrays in the InAs/GaAs(100) System
000421 (2004-03) Dependence of Structural and Optical Properties of QD Arrays in an InAs/GaAs System on Surface Temperature and Growth Rate
000485 (2004) Effect of growth kinetics on the structural and optical properties of quantum dot ensembles
000499 (2003-12) Room-Temperature 1.5-1.6 μm Photoluminescence from InGaAs/GaAs Heterostructures Grown at Low Substrate Temperature
000526 (2003-08) Quantum Dots in InAs Layers of Subcritical Thickness on GaAs(100)
000536 (2003-07) Theoretical and Experimental Study of the Effect of InAs Growth Rate on the Properties of QD Arrays in InAs/GaAs System
000551 (2003-05) Structural and Optical Properties of InAs Quantum Dots in AlGaAs Matrix
000642 (2003) Investigation of the formation of InAs QD's in a AlGaAs matrix
000747 (2002-05) Photoluminescence in the 1.55 μm Wavelength Range in the InGaAs/GaAs System with Quantum Dots and Wells
000763 (2002-03) Effect of the Growth Parameters on the Electron Structure of Quantum Dots in InGaAs/GaAs Heterostructures
000789 (2002) Stoichiometry and absolute atomic concentration profiles obtained by combined Rutherford backscattering spectroscopy and secondary-ion mass spectroscopy: InAs nanocrystals in Si
000955 (2001) Photoluminescence emission (1.3-1.4 μm) from quantum dots heterostructures based on GaAs
000983 (2001) Incorporation of InAs nanostructures in a silicon matrix : growth, structure and optical properties
000A36 (2000-11) The Emission from the Structures with Arrays of Coupled Quantum Dots Grown by the Submonolayer Epitaxy in the Spectral Range of 1.3-1.4 μm
000A45 (2000-09-20) Nanostructured InSiAs Solid Solution Grown by Molecular Beam Epitaxy on the Si(001) Surface
000A59 (2000-07) Study of Multilayer Structures with InAs Nanoobjects in a Silicon Matrix
000A62 (2000-07) Photoluminescence from Multilayer InAs/GaAs Structures with Quantum Dots in the 1.3-1.4 μm Wavelength Range
000A82 (2000-05-08) Structure and optical properties of Si/InAs/Si layers grown by molecular beam epitaxy on Si substrate
000A89 (2000-05) Multilayer Structures with Quantum Dots in the InAs/GaAs System Emitting at a Wavelength of 1.3 μm

List of associated KwdEn.i

Nombre de
documents
Descripteur
27Experimental study
19Molecular beam epitaxy
19Photoluminescence
18Indium compounds
17Gallium arsenides
11Quantum dots
9III-V semiconductors
9Indium arsenides
9Semiconductor quantum dots
8Arsenic compounds
7Semiconductor heterojunctions
5Nanostructured materials
5Semiconductor materials
4Binary compounds
4Crystal growth from vapors
4Excitons
4RHEED
4STM
4Silicon
4Theoretical study
3Epitaxial layers
3Island structure
3Semiconductor epitaxial layers
3Semiconductor growth
3Surface structure
3TEM
3Transmission electron microscopy
2Arrays
2Electron diffraction
2Epitaxy
2Heteroepitaxy
2Heterostructures
2Multilayers
2Nanostructures
2Quantum wells
2Size effect
2Ternary compounds
1Aluminium arsenides
1Annealing
1Arsenic
1Atomic force microscopy
1Band offset
1Buried nanostructure
1Characterization
1Chemical composition
1Chemical interdiffusion
1Composite materials
1Computer aided analysis
1Computerized instrumentation
1Crystal growth
1Density
1Depth profiles
1Electron diffraction crystallography
1Electronic structure
1Elemental semiconductors
1Energy gap
1Fabrication structure relation
1Free carrier
1Gallium nitrides
1Germanium
1Growth mechanism
1Growth rate
1Heterojunctions
1Indium
1Indium nitrides
1Instrumentation
1Interface structure
1Kinetics
1Localization
1Localized states
1Luminescence
1Measuring methods
1Monolayers
1Morphology
1Multilayer
1Multiple quantum well
1Nanocrystal
1Nanotechnology
1Nonstoichiometry
1Optical properties
1Optimization
1Quantum wires
1RBS
1Recording
1SIMS
1Semiconductor quantum wells
1Signal processing
1Solid solutions
1Stokes shift
1Superlattices
1Surface topography
1Temperature
1Temperature dependence

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