Serveur d'exploration sur l'Indium - Analysis (Russie)

Index « Auteurs » - entrée « A. A. Lomov »
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A. A. Lebedev < A. A. Lomov < A. A. Lopukhin  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
000269 (2007) Characterization of InP porous layer by high-resolution X-ray diffraction
000408 (2004-05) Determining Parameters of a Multilayer Heterostructure by Joint Analysis of the X-ray Rocking Curves Measured for Various Crystallographic Planes
000878 (2001-09) Structure of the Interfaces of the InxGa1 - xAs Quantum Well from X-ray Diffraction Data
000A55 (2000-07-20) Structural Characteristics of Multicomponent GaAs-InxGa1 - xAs System from Double-Crystal X-ray Diffractometry Data
000A77 (2000-06) Low-Temperature Photoluminescence and X-ray Diffractometry Study of InxGa1 - xAs Quantum Wells
001421 (1994-08) Study of an InGaAs/GaAs(100) heterostructure by high-resolution x-ray diffractometry
001664 (1992) Investigation of the structure of real indium antimonide surfaces by the asymptotic Bragg diffraction method

List of associated KwdEn.i

Nombre de
documents
Descripteur
6Experimental study
6XRD
4Indium compounds
3Gallium arsenides
3III-V semiconductors
2Arsenic compounds
2Gallium compounds
2Interface structure
2Molecular beam epitaxy
2Semiconductor quantum wells
1Amorphization
1Bragg diffraction
1Coherent scattering
1Crystal face
1Crystal properties
1Crystal structure
1Deformation
1Diffuse scattering
1Digital simulation
1Excitons
1Heterostructures
1High-resolution methods
1Inclination
1Indium Antimonides
1Indium arsenides
1Indium phosphides
1Inorganic compound
1Multilayers
1Oxide layer
1Photoluminescence
1Porous materials
1Reciprocal lattice
1Semiconductor heterojunctions
1Statistical analysis
1Structural analysis
1Surface structure
1Ternary compounds
1Theoretical model
1Thin films
1X ray diffraction

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