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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Keywords » - entrée « Traps »
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Trapping < Traps < Trauma  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
001040 (2002) Carrier recombination in InAs/GaAs self-assembled quantum dots under resonant excitation conditions
001C90 (1997) Deep trap characterisation and conduction band offset determination of Al0.48In0.52As/(Ga0.7Al0.3)0.48In0.52As heterostructures
002071 (1995-02-15) Role of electron traps in the excitation and de-excitation mechanism of Yb3+ in InP
002083 (1995-01-01) Admittance spectroscopy of InAlAs/InGaAs single-quantum-well structure with high concentration of electron traps in InAlAs layers
002115 (1995) Study of deep level defect behaviour in rapid thermal annealed Fe-doped semi-insulating InPeng
002677 (1993) Evolution of the photoconductance decay versus wavelength in silicon doped GalnAs
002745 (1993) A method to correct for leakage current effects in deep level transient spectroscopy measurements on Schottky diodes

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EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i -k "Traps" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i  \
                -Sk "Traps" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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   |area=    IndiumV3
   |flux=    France
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   |clé=    Traps
}}
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