Serveur d'exploration sur l'Indium - Analysis (France)

Index « Keywords » - entrée « Surface topography »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
Surface termination < Surface topography < Surface topography measurement  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 15.
Ident.Authors (with country if any)Title
000093 (2012) Submicron Raman and photoluminescence topography of InAs/Al(Ga)As quantum dots structures
000229 (2011) Elaboration and characterization of polyaniline films electrodeposited on tin oxides
000978 (2005) Electrosynthesis of structured derivated polythiophenes : Application to electrodeposition of latex particles on these substrates
000A56 (2004) Well-ordered (1 0 0) InAs surfaces using wet chemical treatments
000B54 (2004) Enhancement of atomic ordering in In0.53Ga0.47As/InP: a comparison between trimethylarsenic and arsine
000E77 (2002-02-15) Structure, surface composition, and electronic properties of CuInS2 and CuIn(1-x)AlxS2
000E79 (2002-02-01) Near-field probing of active photonic-crystal structures
001330 (2000-07-10) Interplay between segregation, roughness, and local strains in the growth of Ga0.75In0.25P alloy
001352 (2000-01-17) Step-bunching instability in strained-layer superlattices grown on vicinal substrates
001541 (1999-09) Microscopic modeling of InP etching in CH4-H2 plasma
001599 (1999-02) InAlAs/InGaAs metamorphic high electron mobility transistors on GaAs substrate: Influence of indium content on material properties and device performance
001601 (1999-02) High-quality InGaAsN growth by metalorganic vapor-phase epitaxy using nitrogen carrier gas and dimethylhydrazine, tertiarybutylarsine as group V precursors
001841 (1998-08-01) Indium phosphide vapor phase epitaxy at high growth rates, growth kinetics, and characterization
001845 (1998-07-06) Scanning tunneling microscopy and scanning tunneling spectroscopy of self-assembled InAs quantum dots
001855 (1998-07) Surface roughness, strain, and alloy segregation in lattice-matched heteroepitaxy

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis
HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i -k "Surface topography" 
HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i  \
                -Sk "Surface topography" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd 

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    KwdEn.i
   |clé=    Surface topography
}}

Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024