Keywords
Analysis
France
Racine
Analysis
France
Repository
Accueil
Racine
Racine

Serveur d'exploration sur l'Indium - Analysis (France)

Index « Keywords » - entrée « Surface morphology »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
Surface melting < Surface morphology < Surface phase transformations  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 16.
Ident.Authors (with country if any)Title
000047 (2013) Investigation of copper indium gallium selenide material growth by selenization of metallic precursors
000049 (2013) Influence of flexible substrates on inverted organic solar cells using sputtered ZnO as cathode interfacial layer
000155 (2011) The influence of various MOCVD parameters on the growth of Al1-xInxN ternary alloy on GaN templates
000170 (2011) Structural, ferroelectric and dielectric properties of In2O3:Sn (ITO) on PbZr0.53Ti0.47O3 (PZT)/Pt and annealing effect
000197 (2011) MOVPE growth and characterization of po!ar, semipo!ar and nonpo!ar )nN on sapphire substrate : Growth of Group III Nitrides
000213 (2011) High-surface-quality nanocrystalline InN layers deposited on GaN templates by RF sputtering
000260 (2010) The structure of InAlN/GaN heterostructures for high electron mobility transistors
000264 (2010) Surfactant effect of bismuth in atmospheric pressure MOVPE growth of InAs layers on (1 0 0) GaAs substrates
000299 (2010) MOVPE growth and characterization of indium nitride on C-, A-, M-, and R-plane sapphire
000514 (2008) Pulsed electron beam deposition of oxide thin films
000593 (2008) Chemical spray deposition of zinc oxide nanostructured layers from zinc acetate solutions
000784 (2006) Physical properties of RF sputtered ITO thin films and annealing effect
000A03 (2005) Correlation between the Indium Tin Oxide morphology and the performances of polymer light-emitting diodes
000A24 (2004-06-01) Study of thiol-induced adhesion of stressed III-V semiconductor on wax using thin film elastic relaxation
000B33 (2004) Interplay between strain and confinement effects on optical and structural properties in InGaAs/GaAs epilayers and quantum wells
000C87 (2003) Surface and self-organisation of III-V thin films for optoelectronics: Influence of surface orientation and strain on growth mechanisms

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i -k "Surface morphology" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i  \
                -Sk "Surface morphology" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    KwdEn.i
   |clé=    Surface morphology
}}
Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024