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Analysis
France
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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Keywords » - entrée « Strain measurement »
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Strain hardening < Strain measurement < Strain rate  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 5.
Ident.Authors (with country if any)Title
000296 (2010) Microstructure of N-face InN grown on Si (111) by plasma-assisted MBE using a thin GaN-AlN buffer layer
000611 (2007) XRD measurement of thermal strain in InSb-based devices
000707 (2007) Convergent beam electron diffraction for strain determination at the nanoscale
000A49 (2004-01-12) Morphology and composition of highly strained InGaAs and InGaAsN layers grown on GaAs substrate
000C28 (2003-08-04) Strain analysis of a quantum-wire system produced by cleaved edge overgrowth using grazing incidence x-ray diffraction

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