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Analysis
France
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Analysis
France
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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Keywords » - entrée « Reflectometry »
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Reflectivity method < Reflectometry < Reflector  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
000121 (2012) In situ investigations of electrogenerated polybithiophene film growth on indium tin oxide substrate using optical fixed-angle reflectometry
000767 (2006) Structural characterisation of Sb-based heterostructures by X-ray scattering methods
000E38 (2002-08-26) Simple method to diagnose the performance of electroabsorption modulators on InP using optical low-coherence reflectometry
000E94 (2002) Vertical cavity InGaN LEDs grown by MOVPE
001268 (2001) Detection and localization of degradation damaged regions in 1.3 μm laser diodes on InP using low-coherence reflectometry
001649 (1999) Surface effects of heat treatments in active atmosphere on structural, morphological and electrical characteristics of CuInS2 thin films
002B86 (1990) Chemical and structural analysis by ellipsometry and x-ray reflectometry of thin sulfide layers grown on InP

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EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i -k "Reflectometry" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i  \
                -Sk "Reflectometry" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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   |flux=    France
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   |clé=    Reflectometry
}}
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