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Serveur d'exploration sur l'Indium - Analysis (France)

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Internal stress < Internal stresses < International conference  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 13.
Ident.Authors (with country if any)Title
000A24 (2004-06-01) Study of thiol-induced adhesion of stressed III-V semiconductor on wax using thin film elastic relaxation
000C00 (2003-12-15) Raman scattering in large single indium nitride dots: Correlation between morphology and strain
000C24 (2003-08-15) Lattice relaxation by atomic hydrogen irradiation of III-N-V semiconductor alloys
000C28 (2003-08-04) Strain analysis of a quantum-wire system produced by cleaved edge overgrowth using grazing incidence x-ray diffraction
000E14 (2002-12-15) Structural analysis of the indium-stabilized GaAs(001)-c(8×2) surface
001330 (2000-07-10) Interplay between segregation, roughness, and local strains in the growth of Ga0.75In0.25P alloy
001495 (1999-12-15) Strain distribution and optical phonons in InAs/InP self-assembled quantum dots
001544 (1999-08-15) A finite-element study of strain fields in vertically aligned InAs islands in GaAs
001592 (1999-02-15) Diffraction-anomalous-fine-structure spectroscopy applied to the study of III-V strained semiconductors
001856 (1998-07) Soft x-ray photoelectron diffraction study of epitaxial InGaAs/GaAs(001)
001859 (1998-06-15) Bond-length variation in InxGa1-xAs/InP strained epitaxial layers
001A49 (1997-12-01) Observation of strain relaxation phenomena in buried and nonburied III-V surface gratings through high resolution x-ray diffraction
001A50 (1997-12-01) Observation of strain relaxation phenomena in buried and nonburied III-V surface gratings through high resolution x-ray diffraction

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