Serveur d'exploration sur l'Indium - Analysis (France)

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High repetition rate < High resolution < High sensitivity photodiodes  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 16.
Ident.Authors (with country if any)Title
000777 (2006) Simultaneous determination of species by Differential Alternative Pulses Voltammetry
001290 (2001) 3-D Flash LADAR at Raytheon
001F73 (1996) Application of spectrally resolved scanning photoluminescence to assess relaxation processes of InGaAs and InAlAs layers strained in compression and tension
002110 (1995) The consequences of the atomic size effect in quantitative high resolution electron microscopy
002538 (1993) Surface investigation by scanning tunneling microscopy in liquid medium
002617 (1993) Monolayer scale study of segregation effects in InAs/GaAs heterostructures
002A22 (1991) High resolution electron microscopy study of damage created in Si-implanted InP
002B29 (1990) Novel photoemission approach to hot-electron transport in semiconductors
002B65 (1990) Epitaxial growth of InP/InAs/InP quantum wells
002B94 (1990) Amorphous-crystalline phase transformation of supported aggregates produced by indium deposition
002C84 (1989) Characterization of Fe-doped semi-insulating InP by low temperature and room temperature spatially resolved photoluminescence
002D43 (1988) Silver on phosphorus-passivated (100) InP. Interface formation and microstructure
002E21 (1988) Chemical ordering in GaxIn1-xP semiconductor alloy grown by metalorganic vapor phase epitaxy
002F26 (1987) Evidence of the origin of infrared scattering in GaAs with high-resolution infrared tomography
002F69 (1986) Insertion/extraction de lithium dans les chalcogénures ternaires dérivés de la spinelle lacunaire In2S3
002F96 (1986) Residual sulphur and silicon doping in InP and GaInAs

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