List of bibliographic references
Number of relevant bibliographic references: 12.
| Ident. | Authors (with country if any) | Title |
|---|
| 000629 (2007) |
| Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence x-ray techniques |
| 000772 (2006) |
| Spontaneous lateral modulation in short-period superlattices investigated by grazing-incidence x-ray diffraction |
| 000888 (2005) |
| Strain, size and composition of InAs quantum sticks, embedded in InP, determined via X-ray anomalous diffraction and diffraction anomalous fine structure in grazing incidence |
| 000892 (2005) |
| Shape, strain, and ordering of lateral InAs quantum dot molecules |
| 000D27 (2003) |
| Nanostructure and properties of ZnO films produced by the pyrosol process |
| 001009 (2002) |
| Grazing-incidence diffraction anomalous fine structure of InAs/InP(001) self-assembled quantum wires |
| 001528 (1999-10) |
| Incommensurabilité et stoechiométrie des surfaces d'alliages ternaires (In,Ga)As étudiées par diffusion des rayons X en incidence rasante |
| 001649 (1999) |
| Surface effects of heat treatments in active atmosphere on structural, morphological and electrical characteristics of CuInS2 thin films |
| 001710 (1999) |
| Investigation of strain induced patterning in superlattices by grazing incidence diffraction: comparison of morphological and strain ordering |
| 001825 (1998-10) |
| Etude de Détecteurs X au Silicium et réalisation d'une Instrumentation Synchrotron associée |
| 002314 (1994-02) |
| Phénomènes de surface en croissance épitaxiale fortement contrainte de InxGa1-xAs (x>0,25) sur GaAs(001): relaxation élastique, transition 2D-3D, effet surfactant |
| 002B86 (1990) |
| Chemical and structural analysis by ellipsometry and x-ray reflectometry of thin sulfide layers grown on InP |
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