Finite difference time-domain analysis < Finite element method < Finite element program

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List of bibliographic references

Number of relevant bibliographic references: 23.
[0-20] [0 - 20][0 - 23][20-22][20-40]

Ident.	Authors (with country if any)	Title
000043 (2013)		Modeling of Dark Current in HgCdTe Infrared Detectors
000350 (2010)		Cathodoluminescence Study of InP Photonic Structures Fabricated by Dry Etching
000566 (2008)		Impedance Mismatch in Negative Index Photonic Crystals
000770 (2006)		Strain state analysis of InGaN/GaN : sources of error and optimized imaging conditions
000A91 (2004)		Quantitative evaluation of the atomic structure of defects and composition fluctuations at the nanometer scale inside InGaN/GaN heterostructures
000B13 (2004)		Modelling of indium rich clusters in MOCVD InxGa1-xN/GaN multilayers
000B90 (2004)		Adhesive properties of silicone polymers on some typical opto-electronic substrates: influence of the network density
000C28 (2003-08-04)		Strain analysis of a quantum-wire system produced by cleaved edge overgrowth using grazing incidence x-ray diffraction
000E09 (2003)		A visco-plastic model of the deformation of InP during LEC growth taking into account dislocation annihilation
000E60 (2002-06-01)		Composition fluctuation in InGaN quantum wells made from molecular beam or metalorganic vapor phase epitaxial layers
001202 (2001)		Modeling the solute segregation in vertical Bridgman growth by using free-surface technique
001223 (2001)		Influence of the involuntary underetching on the mechanical properties of tunable Fabry-Pérot filters for optical communications
001387 (2000)		Strain mapping of V-groove InGaAs/GaAs strained quantum wires using cross-sectional Atomic Force Microscopy
001543 (1999-08-15)		High resolution electron microscope analysis of lattice distortions and In segregation in highly strained In0.35Ga0.65As coherent islands grown on GaAs (001)
001544 (1999-08-15)		A finite-element study of strain fields in vertically aligned InAs islands in GaAs
001635 (1999)		Transmission electron microscopy analysis of the shape and size of semiconductor quantum dots
001658 (1999)		Strain relaxation at cleaved surfaces studied by atomic force microscopy
001688 (1999)		Optical and mechanical design of an InP based tunable detector for gas sensing applications
001749 (1999)		Elastic stress relaxation in GaInAsP quantum wires on InP
001827 (1998-10)		Analyse quantitative de la relaxation des contraintes à l'échelle atomique, par traitement d'images de microscopie électronique «Haute Résolution», dans des hétérostructures quantiques III-V et II-VI fortement désadaptées
001925 (1998)		Surface relaxation of strained semiconductor heterostructures revealed by finite-element calculations and transmission electron microscopy

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