Digital processing < Digital simulation < Digital switch

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List of bibliographic references

Number of relevant bibliographic references: 45.
[0-20] [0 - 20][0 - 45][20-40]

Ident.	Authors (with country if any)	Title
000025 (2013)		Semibulk InGaN: A novel approach for thick, single phase, epitaxial InGaN layers grown by MOVPE
000032 (2013)		Persistent enhancement of the carrier density in electron irradiated InAs nanowires
000332 (2010)		Efficient terahertz mixer from plasma wave downconversion in InGaAs HEMT
000572 (2008)		Growth of GaInSb concentrated alloys under alternating magnetic field
000629 (2007)		Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence x-ray techniques
000702 (2007)		Deep level transient spectroscopy studies at low temperature of In0.52Al0.48As epilayers
000763 (2006)		Studies of gas sensing, electrical and chemical properties of n-InP epitaxial surfaces
000930 (2005)		Modeling of a space experiment on Bridgman solidification of concentrated semiconductor alloy
000992 (2005)		Diffusion of Zn in CuInSe2 bulk crystals
000999 (2005)		Deciphering output coupling mechanisms in spiral microcavities with femtosecond light bullets
000A64 (2004)		The effect of the static atomic displacements on the structure factors of weak reflections in cubic semiconductor alloys
000A68 (2004)		Syntheses and structural trends of the InxMo15S19 (0≤x≤3.7) compounds containing Mo6 and Mo9clusters
000B08 (2004)		Negative refraction at infrared wavelengths in a two-dimensional photonic crystal
000B12 (2004)		Modelling of visible and near infrared wavelength quantum well devices made of zinc-blende InxGa1-xN
000B34 (2004)		Interfacial stress field generate by a biperiodic hexagonal network of misfit dislocations in a thin bicristal InAs/(111)GaAs
000B73 (2004)		Characterization of multilayered materials for optoelectronic components by high-resolution X-ray diffractometry and reflectometry: contribution of numerical treatments
000C70 (2003)		Wide angle X-ray scattering and atomic force microscopy studies of amorphous In-Se films
000D03 (2003)		Rigorous analysis of the electronic properties of InP interfaces for gas sensing
000D17 (2003)		Optically-induced non-linear optical effects in indium-tin oxide crystalline films
000D99 (2003)		Beam filamentation and maximum optical power in high brightness tapered lasers
000E08 (2003)		Ab initio calculation of intrinsic point defects in CuInSe2

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