Keywords
Analysis
France
Racine
Analysis
France
Repository
Accueil
Racine
Racine

Serveur d'exploration sur l'Indium - Analysis (France)

Index « Keywords » - entrée « Defects »
Attention, ce site est en cours de développement !
Attention, site généré par des moyens informatiques à partir de corpus bruts.
Les informations ne sont donc pas validées.
Defect structure < Defects < Defense  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 16.
Ident.Authors (with country if any)Title
000135 (2012) Defect and phase stability of solid solutions of Mg2X with an antifluorite structure: An ab initio study
000350 (2010) Cathodoluminescence Study of InP Photonic Structures Fabricated by Dry Etching
000399 (2009) Site preference of Eu2+ dopants in the (Ba,Sr)13-xAl22-2xSi10+2xO66 phosphor and its effect on the luminescence properties: a density functional investigation
000661 (2007) Magnetism due to oxygen vacancies and/or defects in undoped semiconducting and insulating oxide thin films
000829 (2006) Ferromagnetism in transition-metal-doped semiconducting oxide thin films
000895 (2005) Resonant Raman spectroscopy on InN
000A76 (2004) Stress and surface energies versus surface nanostructuring: the InGaAs/InP(0 0 1) epitaxial system
000D81 (2003) ESR and NMR studies of CuInSe2 crystals having controlled component activities
000F16 (2002) Structural, optical and electrical properties of the ordered vacancy compound CuIn3Se5 thin films fabricated by flash evaporation
001D38 (1996-11) DEFAUTS ET SEPARATIONS DE PHASE DANS ALINAS PREPARE PAR EPITAXIE PAR JETS MOLECULAIRES INFLUENCE SUR LES PROPRIETES ELECTRIQUES
002115 (1995) Study of deep level defect behaviour in rapid thermal annealed Fe-doped semi-insulating InPeng
002293 (1994-05) Transport électronique à travers des barrières semiconductrices
002313 (1994-02) Rôle du dopage indium sur la nucléation et la propagation des dislocations dans l'arseniure de Gallium
002619 (1993) Microstructure of high-temperature plastically deformed Zn-doped CdTe ; comparison with In-doped Gaas
002643 (1993) Influence of pressure on nitrogen incorporation in ultraviolet chemical vapor deposited SiO2 films
002915 (1992) Determination of complexes and diffusion mechanisms in a GaP/InP strained-layer superlattice

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i -k "Defects" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i  \
                -Sk "Defects" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

Pour mettre un lien sur cette page dans le réseau Wicri

{{Explor lien
   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    France
   |étape=   Analysis
   |type=    indexItem
   |index=    KwdEn.i
   |clé=    Defects
}}
Wicri

This area was generated with Dilib version V0.5.77.
Data generation: Mon Jun 9 10:27:54 2014. Site generation: Thu Mar 7 16:19:59 2024