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Serveur d'exploration sur l'Indium - Analysis (France)

Index « Keywords » - entrée « Contamination »
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Contactless growth < Contamination < Content  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 8.
Ident.Authors (with country if any)Title
000D23 (2003) Nitrogen plasma investigations for GaInAsN MBE growth
001F58 (1996) Effects of the electron beam on InP(100)
002426 (1994) Deep-level characterization of AlxIn1-xAs layers grown by low pressure metal-organic chemical vapor deposition
002708 (1993) Determination of oxygen and carbon contaminations in InGaAs molecular beam epitaxy using growth interruptions
002879 (1992) In situ characterization of InP surfaces after low-energy hydrogen ion cleaning
002D89 (1988) Hydrogen-induced contamination of III-V compound surfaces
002E23 (1988) Characterization of SrF2 thin films and of SrF2/InP structures
002F11 (1987) Influence of oxygen incorporation on beryllium-doped InGaAs grown by molecular beam epitaxy

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/France/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i -k "Contamination" 

HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/KwdEn.i  \
                -Sk "Contamination" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/France/Analysis/biblio.hfd

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   |clé=    Contamination
}}
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