Charge carrier scattering < Charge carrier trapping < Charge carriers

Facettes :

List of bibliographic references

Number of relevant bibliographic references: 53.
[0-20] [0 - 20][0 - 50][20-40]

Ident.	Authors (with country if any)	Title
000002 (2014)		Physical and chemical degradation behavior of sputtered aluminum doped zinc oxide layers for Cu(In,Ga)Se2 solar cells
000238 (2011)		Coulomb charging effect of electrons in InAs/InAlAs quantum dots studied by capacitance techniques
000241 (2011)		Carrier wavefunction control in a dilute nitride-based quantum well-a quantum dot tunnel injection system for 1.3 μm emission
000304 (2010)		Influence of poly (3,4-ethylenedioxythiophene)-poly (styrenesulfonate) in polyfluorene-based light-emitting diodes: Evidence of charge trapping at the organic interface
000330 (2010)		Electrical properties of self-assembled InAs/InAlAs quantum dots on InP
000413 (2009)		Optical and electrical properties of semi-conducting calix[5,9]arene thin films with potential applications in organic electronics
000446 (2009)		High photocarrier mobility in ultrafast ion-irradiated In0.53Ga0.47As for terahertz applications
000613 (2007)		Transport mechanism and trap distribution in ITO/azo-calix[4]arene derivative/al diode structure
000667 (2007)		Local electronic transport through InAs/InP(0 01) quantum dots capped with a thin InP layer studied by an AFM conductive probe
000688 (2007)		Electronic properties of InAs/GaAs nanowire superlattices
000750 (2006)		Transport mechanisms in tris(8-hydroxyquinoline)aluminium (Alq3) electronic layers : a study by photodipolar absorption
000819 (2006)		Hole emission processes from InAs quantum dots grown on p-type InAlAs/InP(001)
000E03 (2003)		Anomalous I versus V characteristics of InGaAs/InAlAs strained multiple quantum well structures for amplitude modulators
000F46 (2002)		Photoconductivity techniques for defect spectroscopy of photovoltaic materials
000F91 (2002)		Irradiation-induced degradation in solar cell: characterization of recombination centres
001036 (2002)		Compared rapid thermal annealing procedures of InP
001505 (1999-12)		TRANSPORT DANS LES COMPOSANTS EN PRESENCE DE CENTRES PROFONDS : MODELISATION NUMERIQUE ET ANALYTIQUE
001795 (1998-12)		ETUDE DES EFFETS PARASITES DANS LES TRANSISTORS A EFFET DE CHAMP A HETEROJONCTION (HFET) SUR SUBSTRAT InP
001895 (1998-01)		ETUDE DES EFFETS PARASITES DU TRANSISTOR A EFFET DE CHAMP A HETEROJONCTION ET CANAL DOPE (HFET) SUR InP
001941 (1998)		Relative absorption strengths of neutral and negatively charged excitons in CdTe quantum wells
001968 (1998)		New γ-In2Se3/TCO (SnO2 or ZnO) thin film rectifying heterojunction

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