Cantilever beam < Capacitance < Capacitance distribution

Facettes :

List of bibliographic references

Number of relevant bibliographic references: 35.
[0-20] [0 - 20][0 - 35][20-34][20-40]

Ident.	Authors (with country if any)	Title
000026 (2013)		Red-blue effect in Cu(In,Ga)Se2-based devices revisited
000124 (2012)		Impedance spectrometry of optimized standard and inverted P3HT-PCBM organic solar cells
000143 (2012)		480-GHz fmax in InP/GaAsSb/InP DHBT With New Base Isolation μ-Airbridge Design
000211 (2011)		Improved External Base Resistance Extraction for Submicrometer InP/InGaAs DHBT Models
000269 (2010)		Small-signal modeling of Emitter-up HBT using an improved analytical approach. Application to InGaAlAs/GaAsSb/InP DHBT with strained base
000443 (2009)		III-phosphides heterojunction solar cell interface properties from admittance spectroscopy
000468 (2009)		Compositional Engineering of Chemical Bath Deposited (Zn,Cd)S Buffer Layers for Electrodeposited CuIn(S,Se)2 and Coevaporated Cu(In,Ga)Se2 Solar Cells
000532 (2008)		New method for interface characterization in heterojunction solar cells based on diffusion capacitance measurements
000720 (2007)		Ballistic nano-devices for high frequency applications
000B58 (2004)		Electrical characterization of ITO/CuPc/Al diodes using temperature dependent capacitance spectroscopy and I-V measurements
000D01 (2003)		Simple and accurate method to extract intrinsic and extrinsic base-collector capacitance of bipolar transistors
000D60 (2003)		Growth of anodic oxides on n-InP studied by electrochemistry and surface analysis. Correlation between oxidation methods and passivating properties
000D94 (2003)		Characterization of ITO/CuPc/AI and ITO/ZnPc/Al structures using optical and capacitance spectroscopy
000E07 (2003)		Admittance spectroscopy for non-crystalline thin film devices characterization: comparison of Cu(In, Ga)Se2 and a-Si:H cases
000E68 (2002-04-15)		Interpretation and theory of tunneling experiments on single nanostructures
000F10 (2002)		Study of a thin anodic oxide on n-InP by photocurrent transient, capacitance measurements and surface analysis
001438 (2000)		Improved bias-thermal-stress method for the insulator charge measurement of BN/InP MIS structures
001448 (2000)		Fabrication and performance of InP-based heterostructure barrier varactors in a 250-GHz waveguide tripler
001636 (1999)		Transferred InP-based HBVs on glass substrate
001751 (1999)		Effect of the T-gate on the performance of recessed HEMTs. A Monte Carlo analysis
001917 (1998)		Theoretical analysis of kink effect in C-V characteristics of indium-implanted NMOS capacitors

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