Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « Y. Robach »
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List of bibliographic references

Number of relevant bibliographic references: 22.
[0-20] [0 - 20][0 - 22][20-21][20-40]
Ident.Authors (with country if any)Title
000237 (2011) Crystallographic orientation transition of InP islands on SrTiO3 substrates with the growth temperature
000A85 (2004) STM and FIB nano-structuration of surfaces to localise InAs/InP(0 0 1) quantum dots
001385 (2000) Strained InAs nanostructures self-organised on high-index InP(113)B
001857 (1998-07) Layer by layer growth mode stabilization and step-edge smoothing of cation-stabilized In1-xGaxAs strained layers grown on InP
001924 (1998) Surface spinodal decomposition in low temperature Al048In052As grown on InP(001) by molecular beam epitaxy
001933 (1998) Strain effect on the growth of 3D In(Ga)As wire structures on InP(001)
001A72 (1997-10-15) Role of surface energy and surface reconstructions on the 2D-to-3D growth-mode transition of strained InxGa1-xAs layers on InP(001)
001B35 (1997-04-15) Role of the step curvature in the stabilization of coherently strained epitaxial structures
001C50 (1997) Influence of step edges elastic relaxation on the morphology of compressively and tensilely strained In1-xGaxAs layers epitaxially grown on InP
001C83 (1997) Elastic misfit stress relaxation in In0.25Ga0.75As layers grown under tension on InP(001)
001E80 (1996) Scanning tunneling microscopy study of the epitaxial growth of strained In0.82Ga0.18As layers on InP
002200 (1995) Correlations between the electrical characteristics of metal-oxide-InP tunnel diodes and the nature of thin interfacial oxides
002203 (1995) Connection of a scanning tunneling microscope with a molecular beam epitaxy chamber and analysis of the vibration isolation system
002538 (1993) Surface investigation by scanning tunneling microscopy in liquid medium
002651 (1993) In situ studies of the anodic oxidation of indium phosphide
002823 (1992) Passivation of InP using In(PO3)3-condensed phosphates : from oxide growth properties to metal-insulator-semiconductor field-effect-transistor devices
002892 (1992) Growth of passivating UV/ozone oxides on InP : correlations between chemical composition and intefacial electrical properties
002898 (1992) Evaluation of surface roughness of technological InP substrates by in situ scanning tunneling microscopy imaging in H2SO4 solution
002C09 (1989) Propriétés électriques des structures MIS sur InP passivé par un oxyde
002D63 (1988) Optical properties of native oxides on InP
003007 (1986) New native oxide of InP with improved electrical interface properties

List of associated KwdEn.i

Nombre de
documents
Descripteur
17Experimental study
10Semiconductor materials
8Indium arsenides
8Molecular beam epitaxy
8Surface structure
7Gallium arsenides
7Indium Phosphides
7STM
6Ternary compounds
5Inorganic compound
4Crystal growth
4III-V semiconductors
4Indium phosphides
3Epitaxial layers
3In situ
3Indium compounds
3Island structure
3Oxidation
3Scanning tunneling microscopy
3Voltage capacity curve
2Atomic force microscopy
2Chemical composition
2Density of states
2Dielectric function
2Elastic deformation
2Electrical properties
2Ellipsometry
2Heterojunctions
2Inorganic compounds
2Interface
2Interface electron state
2Interface states
2MIS structure
2Morphology
2Nucleation
2Passivation
2Photoelectron emission
2RHEED
2Semiconductor epitaxial layers
2Semiconductor growth
2Stress relaxation
2Surface
2Surface reconstruction
2X ray
1Aluminium arsenides
1Amorphous state
1Annealing
1Anodizing
1Aqueous solution
1Arrays
1Arsenic compounds
1Chemical etching
1Compressive stress
1Crystal face
1Crystal growth from vapors
1Crystal orientation
1Crystalline structure
1Cyclic voltammetry
1Electric contact
1Electrochemical reaction
1Electrodes
1Electrolyte solution
1Electronic structure
1Fabrication property relation
1Field effect transistor
1Film growth
1Finite element method
1Gallium compounds
1Growth
1High resolution
1IV characteristic
1Indium Hydrates
1Indium Oxides
1Indium Phosphates Oxides Mixed
1Indium phosphide
1Instrumentation
1Insulation
1Interface structure
1Ion beams
1Liquid medium
1Liquid solid interface
1MIS transistors
1Mechanical vibrations
1Modified material
1N type conductivity
1Nanostructures
1Nanotechnology
1Oxide layer
1Oxides
1Phase separation
1Phosphoric acid
1Photoelectron spectrometry
1Propanediol
1Pyrographite
1Quantum dots
1Roughness
1Scanning probe microscopy
1Schottky barrier diodes
1Self organization
1Solid solutions

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